CTM · E-5 BIB · Entry 17 of 25 · Publication

NAVY ELECTRICITY AND ELECTRONICS TRAINING SERIES MODULE 16- TEST EQUIPMENT

NAVEDTRA 14188A · CHAPTER 1, 6

Chapter 1 Test Equipment Administration and Use

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1-1 UNCLASSIFIED 1 TEST EQUIPMENT ADMINISTRATION AND USE LEARNING OBJECTIVES

Learning objectives are stated at the beginning of each chapter. These learning objectives serve as a preview of the information you are expected to learn in the chapter. The comprehensive check questions are based on the objectives. By successfully completing the NRTC, you indicate that you have met the objectives and have learned the information. The learning objectives are listed below.

1. Upon completing this chapter, you should be able to: 2. Describe the Ship Configuration and Logistic Support Information System (SCLSIS). 3. State the differences between calibration and repair. 4. Explain the various calibration status labels used by the Navy. 5. List the procedures for obtaining repairs to test equipment. 6. Describe the Metrology Automated System for Uniform Recall and Reporting (MEASURE) System and the purpose of the Metrology Equipment Recall and Reporting (METER) card and recall schedule. 7. Describe major test equipment references available to you. 8. Explain the purposes and benefits of testing. 9. State the safety precautions involved in working with test equipment. 10. List three precautions you should observe to avoid damaging electric measuring instruments. 11. State the correct procedures for using a safety shorting probe. 12. Describe resistance, voltage, and current measurements in terms of purposes, methods, and instruments used. 13. Describe how capacitance and inductance are measured. 14. Explain the operation of bridges in the measurement of unknown resistances, capacitances, and inductances.

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1-2 UNCLASSIFIED 1.1 INTRODUCTION One purpose of this chapter is to acquaint you with the practical use of test equipment. The presence of adequate test equipment in your shop is not in itself a "cure-all" for making repairs to complex electronic equipment. You must know how to best use the equipment available. First, however, you must understand the basis of electronic theory and be able to apply it to the system under repair.

Another purpose of this chapter is to introduce you to calibration and repair procedures, and basic voltage and current measurements. You will also learn how ac bridges are used for precise measurements of resistance, capacitance, and inductance.

Much of the theory of operation and practical applications of the basic types of test instruments used in electrical and electronic circuits are found in the instruction books and technical manuals that accompany various equipments. You should read and understand these books before you attempt to use any test instrument. You should also know the established safety precautions to ensure your safety and safe equipment operating procedures to protect equipment from damage.

1.2 TEST EQUIPMENT IDENTIFICATION One of the first things you must learn as a maintenance technician is how to identify the various electronic equipment and components by their appropriate nomenclatures. You will find that several methods are used to identify test equipment used; this may be somewhat confusing to you at first. For example, a Tektronix Model 541A oscilloscope can also be identified as a CBTV-541A. The Joint Electronics Type Designation System (JETDS) is used by all branches of the military to identify equipment by a system of standardized nomenclatures.

Q-1. What system is currently used by all branches of the military to identify test equipment?

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1-3 UNCLASSIFIED 1.3 ELECTRONIC TEST EQUIPMENT CLASSIFICATION The Electronic Test Equipment Classification Board was established in 1973 to control the increased use of undesirable electronic test equipment (ETE) in fleet and shore activities. The board classifies electronic test equipments as GENERAL PURPOSE (GPETE) or SPECIAL PURPOSE (SPETE) and assigns responsibility for their management. Items classified as general purpose are managed by the Space and Warfare Systems Command (SPAWARSYSCOM). Items classified as special purpose are managed by the individual systems command that generates the requirement.

GPETE is test equipment that has the capability, without modification, to generate, modify, or measure a range of parameters of electronic functions required to test two or more equipments or systems of basically different design.

Special-purpose electronic test equipment (SPETE) is specifically designed to generate, modify, or measure a range of parameters of electronic functions of a specific or peculiar nature required to test a single system or equipment. These special test equipments are procured by the systems command that has the responsibility for the system/equipment requiring the SPETE for maintenance.

Q-2. Name the two classes of test equipment. Q-3. What test equipment is designed to generate, modify, or measure a range of parameters of electronic functions of a specific nature required to test a single system or equipment? Until the ETE classification board was established, the uncontrolled increase in use of nonstandard GPETE had resulted in loss of inventory control and increased support costs. NESEA has the responsibility for evaluating requests to purchase nonstandard GPETE and for recommending its approval or disapproval to NAVSEA. NAVSEA will then forward its final decision to the originating command for such requests.

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1-4 UNCLASSIFIED 1.3.1 Ship Configuration and Logistic Information System (SCLSIS) Program The Navy must maintain, update, and calibrate thousands of pieces of equipment. To do this, the SHIP CONFIGURATION AND LOGISTIC SUPPORT INFORMATION SYSTEM (SCLSIS) program was designed to keep track of all installed and portable equipment in the fleet. SCLSIS is used to keep up with the existence, location, and changes made to equipment. The SCLSIS program seeks to improve the quality of equipment reporting, provide information needed by other Navy management systems, and reduce record keeping. It is also designed to assist Navy supply systems that furnish spares, documentation, and training necessary to support installed and portable equipment.

Therefore, the inventory of assigned test equipment on board ship is directly related to SCLSIS records. Properly maintained SCLSIS records also show the complete inventory of test equipment on board by quantity, serial number, and location. The SCLSIS program has two basic elements: (1) VALIDATION, to establish a baseline data inventory, and (2) INVENTORY UPDATING, to correct errors or omissions and to document configuration changes.

Q-4. Name the two basic elements of the SCLSIS program.

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1-5 UNCLASSIFIED 1.4 CALIBRATION AND REPAIR PROCEDURES The difference between the terms calibration and repair needs to be addressed before we proceed further. Calibration is little more than checking, adjusting, or systematically aligning a test instrument to a known standard. To do this, you must ensure that the equipment you send to the calibration lab is in working order.

The calibration lab is where actual repair work becomes important. Obvious problems, such as open power cords, burned components, broken meters, and missing hardware, should be repaired or replaced before sending equipment to the calibration lab. Most calibration labs with which you will deal will be part of an intermediate maintenance activity (IMA) on board a tender.

1.4.1 Calibration Status You can determine the calibration status of any test equipment by checking the calibration label or tag located on the equipment. These calibration labels or tags advise you as to whether the item is usable and within its calibration interval. Tags and labels to be used in the METROLOGY CALIBRATION (METCAL) coordination program are listed in the following paragraphs. No other calibration labels or tags are authorized to be placed on test equipment.

1.4.1.1 Calibrated Label The CALIBRATED label, shown in view A of figure 1-1, has black lettering and a white background and comes in two sizes. It is the most commonly used label in the METCAL program. This label indicates that the instrument to which it is attached is within its applicable tolerance on all parameters. If there are any qualifying conditions for use of the instrument, one of the other labels described in the next paragraphs should be used.

1.4.1.2 Calibrated - Refer to Report Label The CALIBRATED - REFER TO REPORT label, shown in view B of figure 1-1, has red lettering and a white back ground. It comes in two sizes and is used when you must know the actual measurement values to use the instrument.

Q-5. What calibration label is used when actual measurement values must be known to use the test equipment?

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1-6 UNCLASSIFIED

Figure 1-1 Calibration labels and tags

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1-7 UNCLASSIFIED 1.4.1.3 Special Calibration Labels Two SPECIAL CALIBRATION labels are shown in view C of figure 1-1 that have black lettering and a yellow background; the size and content of the labels are different. A SPECIAL CALIBRATION tag (figure 1-1, view C) is used with the smaller of the two labels. These labels or tag are used when some unusual or special condition in the calibration should be drawn to your attention.

Such special conditions may be deviations from usual calibration tolerances, multiple calibration intervals, or a requirement for in-place calibration. The special condition that resulted in the SPECIAL CALIBRATION label should be described on the large label when sufficient space is available on the instrument or on the tag when the small label is used. Brief descriptions of special conditions are provided in the following paragraphs.

Q-6. An instrument that must be calibrated in place requires what type of calibration label? In cases where you do not require full instrument capability, the calibration can be performed with reduced tolerances or cover less than all ranges and parameters. This approach is often used when the instrument does not meet full calibration tolerances on certain ranges or parameters, but can still meet user requirements. On the other hand, the special calibration may be for higher accuracy than usual on a short-term basis upon your specific request.

MULTIPLE CALIBRATION INTERVALS - Some instruments have components that require calibration less frequently than the rest of the instrument. For example, the attenuator in a signal generator may require calibration every 12 months, whereas the rest of the instrument parameters should be calibrated every 4 months. Since the attenuator calibration is time consuming and may require unavailable standards, use of the multiple- interval approach can save considerable time (man-hours) as well as permit the more frequent calibration to be performed at a lower level laboratory.

When a specific instrument has been designed for multiple calibration intervals, such information is provided in the applicable calibration procedure. The SPECIAL CALIBRATION label or tag is annotated with the words MULTIPLE INTERVAL, and the type of calibration performed is indicated; for example, partial 1 of 2, 2 of 2, complete calibration, and so forth. The calibration due date reflects the due date of the next partial or complete calibration.

CALIBRATION IN-PLACE - Some instruments should be calibrated in-place. Annotation on the SPECIAL CALIBRATION label or tag will alert both you and the calibrator that the instrument should not be removed, but should be calibrated in-place.

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1-8 UNCLASSIFIED 1.4.1.4 User Calibration Label Some test and measuring equipment (T&ME) should be calibrated by you instead of your referring the instrument to a calibration facility. For example, some instruments, such as hardness testers and densitometers, are provided with their own standards and should be calibrated each time used, or at least very frequently. Some instruments, such as oscillographic recorders, may require calibration before, during, and after each use.

Other automatic test equipment (ATE) has self-calibration tests that should be performed each time used or each day of use. Still other instruments are calibrated as part of checkout procedures performed daily or weekly and recorded in maintenance logs. Whenever recognized, the requirement for calibration by the user and the calibration interval (each use - daily, weekly, every 100 hours - each overhaul, and so forth) is indicated in the Metrology Requirements List (METRL).

The USER CALIBRATION label, shown in view D of figure 1-1, has black lettering and a white background and is affixed when the calibration is performed by the user; however, this label is not replaced at each calibration. When the label is first attached to the instrument, it is annotated as to the appropriate calibration interval. Records of calibrations performed, when other than each time used, should be by normal maintenance practices; that is, in the maintenance log, on maintenance action forms, and so forth.

1.4.1.5 Inactive - Calibrate Before Use Label In the event that an individual instrument due for recalibration will not be used for some time in the future, you may indefinitely postpone the recalibration by affixing an inactive label to the instrument. As shown in view E of figure 1-1, the INACTIVE - CALIBRATE BEFORE USE label has green lettering and a white background. The INACTIVE label remains on the instrument until it is recalibrated. The instrument is not to be used while bearing this label.

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1-9 UNCLASSIFIED 1.4.1.6 Calibration Not Required Label Test equipment standards and T&ME not requiring calibration are shown as CALIBRATION NOT REQUIRED. This label, shown in view F of figure 1-1, has orange letters and a white background. It is attached to and should remain on the instrument indefinitely unless its calibration requirements change. If the instrument is not listed in METRL, you should use the following criteria when placing instruments in the CALIBRATION NOT REQUIRED category:

• Instrument does not make quantitative measurements nor provide quantified outputs. • The device is "fail-safe"; that is, operation beyond specified tolerances will be apparent to the user. • All measurement/stimulus circuits are monitored during use by calibrated instruments or are dependent on external known or calibrated sources for performance within required limits. (When determining that an instrument falls into the CALIBRATION NOT REQUIRED category, you should annotate the label as to the authority for the decision, such as METRL, technical manual, letter or message from higher authority.)

1.4.1.7 Rejected - refer To Attached Tag Label In the event that an instrument fails to meet the acceptance criteria during calibration and cannot be adequately repaired, a REJECTED - REFER TO ATTACHED TAG label is placed on the instrument and all other servicing labels removed. This label, as shown in view G of figure 1-1, has black letters and a red background. In addition to the REJECTED label, a REJECTED tag, giving the reason for rejection and other information as required, is attached to the instrument. Both the label and tag remain on the instrument until it is repaired and recalibrated. The instrument is not to be used while bearing a REJECTED label.

1.4.1.8 Calibration Void If Seal Broken Label The CALIBRATION VOID IF SEAL BROKEN label, shown in view H of figure 1-1, has black letters and a white background. It is placed over readily accessible (usually exterior) adjustments to prevent tampering by the user when such tampering could affect the calibration. The label should not be used to cover adjustments or controls that are part of the normal use and operation of the instrument. This label may also be used to prevent removal and/or interchange of plug-ins, modules, subassemblies, and so forth, when such removal or interchange would affect the calibration.

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1-10 UNCLASSIFIED 1.4.2 Repair Procedures If you are unable to replace a known failed component with onboard spares, you can often locate the replacement component from other supply sources. The replacement component can then be delivered, along with the inoperative equipment, to the IMA. So by sending the repair part along with the equipment, you can reduce repair time considerably. This is particularly true when your unit is getting under way and no time is available for you to complete the repair before calibration. Most operational commands have a higher supply priority for purchase of repair parts than the IMA can use.

1.4.2.1 "No Reject" Policy IMAs have a "no reject" policy on test equipment to provide operational test equipment in a timelier manner. The "no reject" policy says, in effect, that test equipment submitted to the IMA for calibration, which is later found to require repair, will be repaired by the repair department of the IMA. Before this policy, any equipment found inoperative by the calibration lab was marked REJECTED, the reasons stated, and the equipment returned uncalibrated to the ship for repairs. The "no reject" policy does not relieve you of your responsibility to ensure your equipment is in working order prior to submitting it for calibration. Its purpose is to streamline the procedure and cut down delays in returning your equipment to you calibrated and ready to use.

1.4.2.2 Responsibility for Repair and Maintenance of Test Equipment Generally, the responsibility for repair and maintenance of test equipment is placed on maintenance personnel. In some cases, however, maintenance personnel are not authorized to make repairs. Then the test instrument must be sent to a shore repair/calibration facility.

Q-7. Responsibility for repair and maintenance of test equipment generally rests with what group of personnel? When test equipment is sent for calibration and repair, all accessories, such as probes, adapters, and calibration sheets, should be included. Only in emergencies or special situations should partial repair or calibration be attempted on test equipment designated as nonrepairable. Such emergency repairs should be noted on a tag attached to the unit and an entry made on the MEASURE card (discussed shortly). The equipment should then be sent at the earliest opportunity to an authorized facility so that permanent repairs can be made and the unit calibrated.

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1-11 UNCLASSIFIED 1.4.3 Stowage and Handling of Test Equipment Most electronic test equipment is precision equipment. Such equipment must be handled with care to properly perform its designed functions. Rough handling, excessive heat, moisture, and dust all affect the useful life of the equipment. Bumping or dropping a test instrument may ruin the calibration of a meter, cause short circuits, or damage electronic elements inside the case. Sharp bends, creases, or dents in coaxial test cables can alter the expected attenuating effect and cause false meter readings or measurements. Forced air cooling, dust filters, and heaters are used in many pieces of equipment. This test equipment requires clean air filters for proper ventilation and a warm-up period that permits units in the equipment to maintain calibrated standards.

Electronic test equipment should be stowed in a dry location with the dust cover (if provided) in place. Dust covers for spare plug-in units should be constructed for such stowage. For ease in performing maintenance, the test equipment should be stowed at a location convenient to equipment spaces. If possible, related test equipment should be mounted in the equipment spaces. This reduces the problem of finding adequate stowage space elsewhere.

In stowage spaces, individual pieces of test equipment should be held in place by stretch seat-belt-type straps. If bars are used to hold equipment on shelves, meters and control knobs should be protected by blocking the equipment to prevent it from rolling and sliding on the shelf. Test equipment too large for shelf stowage should be kept in stowage cases and tie-downs provided to secure the cases. Refer to Stowage Guide for Portable Test Equipment, NAVSEA ST000-AB-GYD-010/GPETE, to determine adequate stowage space and proper weight support requirements.

1.4.4 The Metrology Automated System for Uniform Recall and Reporting (Measure) For the sake of simplicity, we will use the more commonly used acronym MEASURE instead of the full name to describe this system in the next discussion.

MEASURE is a data processing system designed to provide a standardized system for the recall and scheduling of test, measurement, and diagnostic equipment (TMDE) into calibration facilities. It also provides for the documentation of data pertaining to the calibration actions performed by these facilities.

The primary reference document that describes the operation of the MEASURE system is Metrology Automated System for Uniform Recall and Reporting (MEASURE) Users Manual, OP 43P6A. The Chief of Naval Operations oversees this program and establishes policy and guidelines.

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1-12 UNCLASSIFIED Q-8. What Navy office oversees the MEASURE program? Each naval activity must ensure that the test equipment for which it has been assigned primary responsibility is submitted on a timely basis to a calibration activity for required calibration.

The MEASURE program is designed to assist these naval activities in the fulfillment of this responsibility. MEASURE does this by providing for the automatic scheduling and recall of all such test equipment for calibration.

Each activity submits an initial inventory, using the form shown in figure 1-2, to its Metrology Calibration Representative (METCALREP) for approval. The METCALREP then forwards the inventory to the Measure Operational Control Center (MOCC). The MOCC, based on the information contained on these inventory report forms, provides the necessary preprinted Metrology Equipment Recall and Reporting (METER) card. Figure 1-3 illustrates a MEASURE METER card.

Figure 1-2 MEASURE TMDF Inventory report form

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1-13 UNCLASSIFIED

Figure 1-3 MEASURE METER card

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1-14 UNCLASSIFIED In part, the METER card is preprinted with information taken from the initial inventory data submitted on the inventory report forms together with such updated data as may appear on any prior METER card. The remaining information required is entered on the card by the user of the equipment or the calibration activity, as appropriate.

The METER card is used to report changes, additions, or deletions to the user activity’s inventory. It is also used to report changes in custody of the item of test equipment. The procedure for filling out the METER card is outlined in the appendixes of the MEASURE Users Manual. Blank METER cards can be obtained through the responsible METCALREP.

A computer printout recall schedule is also generated by the MEASURE system. The purpose of this printout is to list those items of equipment that are due for calibration. Each recall schedule is composed of a set of four identical copies. One set is provided to the calibration activity as an aid to workload planning; a second set is sent to the user’s activity. The recall schedule is one of several products/formats sent automatically by the MEASURE Operation Control Center to the user activity on a regular basis. The MOCC automatically distributes the following products to user activities at the intervals shown:

DOCUMENT TITLE TYPE DOCUMENT INTERVAL Format 215 Unmatched listing As required Format 310 Test equipment inventory Monthly Format 350 Test equipment inventory in sub- custodian order Monthly Format 804 Recall schedule for on-site equipment Monthly/Quarterly Replenishment cards Preprinted METER card As required Blank METER cards Initial issue

1.4.5 Test Equipment References Several publications that contain information concerning test equipment are required to be maintained aboard ship by type commander instructions. These requirements are usually found in the inspection checkoff list. Other publications, while not required by directive, are necessary to you as reference and study material so you will be able to administer an effective test equipment program. Technicians should become familiar with the publications/directives listed in appendix II of this module.

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1-15 UNCLASSIFIED 1.5 INTRODUCTION TO TROUBLESHOOTING Our military forces increasingly rely on electrical and electronic equipment to help perform their mission. The effectiveness of our tactical forces depends on many types of electronic systems, such as communications systems, detection systems, and fire control systems. The reliability of such equipment is determined by many factors; however, the primary factors are the quality of the equipment in use, the availability of spare parts, and the ability of maintenance personnel to perform adequate maintenance.

Maintenance is work done to correct, reduce, or counteract wear, failure, and damage to equipment. Maintenance of electrical and electronic equipment is divided into two main categories: PREVENTIVE (routine) and CORRECTIVE maintenance. Preventive maintenance consists of mechanical, electrical, and electronic checks to determine whether equipment is operating properly. It also consists of visual inspections of cabling and equipment for damage and to determine if lubrication is needed. Corrective maintenance isolates equipment failure by means of test techniques and practices; it also replaces defective parts and realigns or readjusts equipment to bring it back to proper performance.

Q-9. What are the two main categories of maintenance? Q-10. What type of maintenance involves isolating equipment troubles and replacing defective parts? Testing and troubleshooting are the areas of maintenance that require the greatest technical skill. Testing procedures are referred to as measurements, tests, and checks. The definitions of these terms often overlap, depending on their use and the results obtained. For example, a power measurement and a frequency check could constitute a test of the operation of the same radio transmitter.

Troubleshooting is a term which we in the electronics field use daily. But what does it mean? Troubleshooting is sometimes thought to be the simple repair of a piece of equipment when it fails to function properly. This, however, is only part of the picture. In addition to repair, you, as a troubleshooter, must be able to evaluate equipment performance. You evaluate performance by comparing your knowledge of how the equipment should operate with the way it is actually performing. You must evaluate equipment both before and after repairs are accomplished.

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1-16 UNCLASSIFIED Equipment performance data, along with other general information for various electronic equipments, is available to help you in making comparisons. This information is provided in performance standards books for each piece of equipment. It illustrates what a particular waveform should look like at a given test point or what amplitude a voltage should be, and so forth. This data aids you in making intelligent comparisons of current and baseline operating characteristics for the specific equipment assigned to you for maintenance. ("Baseline" refers to the initial operating conditions of the equipment on installation or after overhaul when it is operating according to design.)

Remember, maintenance refers to all actions you perform on equipment to retain it in a serviceable condition or to restore it to proper operation. This involves inspecting, testing, servicing, repairing, rebuilding, and so forth. Proper maintenance can be performed only by trained personnel who are thoroughly familiar with the equipment. This familiarity requires a thorough knowledge of the theory of operation of the equipment.

A logical and systematic approach to troubleshooting is of the utmost importance in your performance of electronics maintenance. Many hours have been lost because of time- consuming "hit-or-miss" (often referred to as "easter-egging") methods of troubleshooting.

1.5.1 General Test Equipment Information In any maintenance training program, one of your most important tasks is to learn the use of test equipment in all types of maintenance work. To be effective in maintenance work, you must become familiar not only with the common types of measuring instruments, but also with the more specialized equipment. Some examples of common types of typical measuring instruments are the ammeter, voltmeter, and ohmmeter; examples of specialized test equipment are the spectrum analyzer, dual-trace oscilloscope, and power and frequency meters.

1.5.2 Test Equipment Safety Precautions The electrical measuring instruments included in test equipment are delicately constructed and require certain handling precautions to prevent damage and to ensure accurate readings. In addition, to prevent injury to personnel, you must observe precautions while using test equipment. You can find a list of applicable instructions in appendix II of this module.

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1-17 UNCLASSIFIED 1.5.2.1 Instrument Precautions To prevent damage to electrical measuring instruments, you should observe the precautions relating to three hazards: mechanical shock, exposure to magnetic fields, and excessive current flow.

MECHANICAL SHOCK - Instruments contain permanent magnets, meters, and other components that are sensitive to shock. Heavy vibrations or severe shock can cause these instruments to lose their calibration accuracy.

EXPOSURE TO STRONG MAGNETIC FIELDS - Strong magnetic fields may permanently impair the accuracy of a test instrument. These fields may impress permanent magnetic effects on permanent magnets, moving-coil instruments, iron parts of moving-iron instruments, or in the magnetic materials used to shield instruments.

EXCESSIVE CURRENT FLOW - This includes various precautions, depending on the type of instrument. When in doubt, use the maximum range scale on the first measurement and shift to lower range scales only after you verify that the reading can be made on a lower range. If possible, connections should be made while the circuit is de- energized. All connections should be checked to ensure that the instrument will not be overloaded before the circuit is reenergized.

1.5.2.2 Other Instrument Precautions Precautions to be observed to prevent instrument damage include the following:

• Keep in mind that the coils of wattmeters, frequency meters, and power meters may be carrying large quantities of current even when the meter pointer is on scale. • Never open secondaries of current transformers when the primary is energized. • Never short-circuit secondaries of potential transformers the primary is energized. • Never leave an instrument connected with its pointer off-scale or deflected in the wrong direction. • Ensure that meters in motor circuits can handle the motor starting current. This may be as high as six to eight times the normal running current. • Never attempt to measure the internal resistance of a meter movement with an ohmmeter since the movement may be damaged by the current output from the ohmmeter. • Never advance the intensity control of an oscilloscope to a position that causes an excessively bright spot on the screen; never permit a sharply focused spot to remain stationary for any period of time. This results in burn spots on the face of the cathode-ray tube (CRT).

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1-18 UNCLASSIFIED • In checking electron tubes with a tube tester that has a separate "short test," always make the short test first. If the tube is shorted, no further test should be made. • Before measuring resistance, always discharge any capacitors in the circuit to be tested. Note and record any points not having bleeder resistors or discharge paths for capacitors. • Always disconnect voltmeters from field generating or other highly inductive circuits before you open the circuit.

Q-11. Which quantity (voltage or current) determines the intensity of an electrical shock? Situations can arise during the use of test equipment that are extremely dangerous to personnel. For example, you may have an oscilloscope plugged into one receptacle, an electronic meter plugged into another, and a soldering iron in still another. Also, you may be using an extension cord for some equipments and not others or may be using other possible combinations. Some of the hazards presented by situations such as these include contact with live terminals or test leads. In addition, cords and test leads may be cross connected in such a manner that a potential difference exists between the metal cases of the instruments. This potential difference may cause serious or fatal shocks.

Test leads attached to test equipment should, if possible, extend from the back of the instruments away from the observer. If this is not possible, they should be clamped to the bench or table near the instruments.

At times, you may use instruments at locations where vibration is present, such as near a diesel engine. At such times, the instruments should be placed on pads of folded cloth, felt, or similar shock-absorbing material.

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1-19 UNCLASSIFIED 1.5.3 Working on Energized Circuits Insofar as is practical, you should NOT undertake repair work on energized circuits and equipment. However, it could become necessary, such as when you make adjustments on operating equipment. In such cases, obtain permission from your supervisor, then proceed with your work, but carefully observe the following safety precautions:

• DO NOT WORK ALONE. • Station an assistant near the main switch or circuit breaker so the equipment can be immediately de-energized in case of an emergency. • Someone qualified in first aid for electrical shock should be standing by during the entire operation. • Ensure that you have adequate lighting. You must be able to see clearly if you are to perform the job safely and properly. • Be sure that you are insulated from ground by an approved rubber mat or layers of dry canvas and/or wood. • Where practical, use only one hand, keeping the other either behind you or in your pocket. • If you expect voltage to exceed 150 volts, wear rubber gloves. • DO NOT work on any type of electrical apparatus when you are wearing wet clothing or if your hands are wet. • DO NOT wear loose or flapping clothing. • The use of thin-soled shoes and shoes with metal plates or hobnails is prohibited. • Flammable articles, such as celluloid cap visors, should not be worn. • Remove all rings, wristwatches, bracelets, and similar metal items before working on the equipment. Also ensure that your clothing does not contain exposed metal fasteners, such as zippers, snaps, buttons, and pins. • Do not tamper with interlock switches; that is, do not defeat their purpose by shorting them or blocking them open. • Ensure that equipment is properly grounded before energizing. • De-energize equipment before attaching alligator clips to any circuit. • Use only approved meters and other indicating devices to check for the presence of voltage.

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1-20 UNCLASSIFIED • Observe the following procedures when measuring voltages in excess of 300 volts: o Turn off the equipment power. o Short-circuit or ground the terminals of all components capable of retaining a charge. o Connect the meter leads to the points to be measured. o Remove any terminal grounds previously connected. o Turn on the power and observe the voltage reading. o Turn off the power. o Short circuit or ground all components capable of retaining a charge. o Disconnect the meter leads. • On all circuits where the voltage is in excess of 30 volts and where decks, bulkheads, or workbenches are made of metal, you should insulate yourself from accidental grounding by using approved insulating material. The insulating material should have the following qualities: o It should be dry, without holes, and should not contain conducting materials. o The voltage rating for which it is made should be clearly marked on the material. The proper material should be used so that adequate protection from the voltage can be supplied. o Dry wood may be used or, as an alternative, several layers of dry canvas, sheets of phenolic (resin or plastic) insulating material, or suitable rubber mats. o Care should be exercised to ensure that moisture, dust, metal chips, and so forth, which may collect on insulating material, are removed at once. Small deposits of such materials can become electrical hazards. o All insulating materials on machinery and in the area should be kept free of oil, grease, carbon dust, and so forth, since such deposits destroy insulation.

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1-21 UNCLASSIFIED 1.5.4 Safety Shorting Probe A representative shorting probe is shown in figure 1-4. An approved shorting probe is shown in NAVSEA 0967-LP-000-0100, EIMB, General, Section 3.

CAUTION

Capacitors and cathode-ray tubes may retain their charge for a considerable period of time after having been disconnected from the power source.

Always assume there is a voltage present when working with circuits having high capacitance, even when the circuit has been disconnected from its power source.

An approved type of shorting probe should be used to discharge capacitors and cathode-ray tubes individually.

When using the safety shorting probe, always be sure to first connect the test clip to a good ground (if necessary, scrape the paint off the grounding metal to make a good contact). Then hold the safety shorting probe by the insulated handle and touch the probe end of the shorting rod to the point to be shorted out. The probe end is fashioned so that it can be hooked over the part or terminal to provide a constant connection by the weight of the handle alone. Always take care not to touch any of the metal parts of the safety shorting probe while touching the probe to the exposed "hot" terminal. It pays to be safe; use the safety shorting probe with care.

Some equipment is provided with walk-around shorting devices, such as fixed grounding studs or permanently attached grounding rods. When that is the case, the walk-around shorting devices should be used rather than the safety shorting probe.

Figure 1-4 Representative safety shorting probe

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1-22 UNCLASSIFIED Q-12. What tool is used to de-energize capacitors in a circuit that has been disconnected from its power source? 1.5.5 Working on De-Energized Circuits When any electronic equipment is to be repaired or overhauled, certain general safety precautions should be observed. They are as follows:

• Remember that electrical and electronic circuits often have more than one source of power. Take time to study the schematics or wiring diagrams of the entire system to ensure that all sources of power have been disconnected • If pertinent, inform the remote station regarding the circuit on which work will be performed. • Use one hand when turning switches on or off. • Safety devices, such as interlocks, overload relays, and fuses, should never be altered or disconnected except for replacement. In addition, they should never be changed or modified in any way without specific authorization. • Fuses should be removed and replaced only after the circuit has been de- energized. When a fuse "blows," the replacement should be of the same type and have the same current and voltage ratings. A fuse puller should be used to remove and replace cartridge fuses. • All circuit breakers and switches from which power could possibly be supplied should be secured (locked if possible) in the OPEN or OFF (safe) position and danger tagged in accordance with procedures in the Standard Organization and Regulations of the U.S. Navy, OPNAVINST 3120.32. • After the work has been completed, the tag (or tags) should be removed only by the same person who signed it (them) when the work began. • Keep clothing, hands, and feet dry if at all possible. When you must work in wet or damp locations, place a rubber mat or other nonconductive material on top of a dry, wooden platform or stool; then use the platform or stool to sit and stand on. Use insulated tools and insulated flashlights of the molded type when you are required to work on exposed parts.

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1-23 UNCLASSIFIED 1.5.6 Grounding of Power Tools and Equipment The possibility of electrical shock can be reduced by ensuring that all motor and generator frames, metal bases, and other structural parts of electrical and electronic equipment are at ground potential.

Normally, on steel-hull vessels, such grounds are inherently provided because the metal cases or frames of the equipment are in contact with one another and with the metal structure of the vessel. In some instances where such inherent grounding is not provided by the mounting arrangements, such as equipment supported on shock mounts, suitable ground connections must be provided.

The grounding wire used for this purpose is generally made of flexible material (copper or aluminum) that provides sufficient current-carrying capacity to ensure an effective ground. In this manner, equipment cases and frames that are not intended to be above ground potential are effectively grounded; also, the possibility of electrical shock to personnel coming in contact with metal parts of the equipment is minimized. The secondary purpose of grounding equipment is to improve the operation and continuity of service of all equipments.

Paint, grease, or other foreign matter can interfere with the positive metal-to-metal contact at the ground connection point. Therefore, all bonding surfaces (connection points or metallic junctions) must be securely fastened and free of such matter. In all instances where equipment grounding is provided, certain general precautions and preventive maintenance measures must be taken. A few of these precautions are listed below:

• Periodically clean all strap-and-clamp connectors to ensure that all direct metal- to-metal contacts are free from foreign matter. • Check all mounting hardware for mechanical failure or loose connections. • Replace any faulty, rusted, or otherwise unfit grounding strap, clamp, connection, or component between the equipment and the ground to the ship’s hull. • When replacing a part of the ground connection, make certain that the metallic contact surfaces are clean and that electrical continuity is re-established. • After completing the foregoing steps, recheck to be sure that the connection is securely fastened with the correct mounting hardware. Paint the ground strap and hardware in accordance with current procedures.

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1-24 UNCLASSIFIED Because of the electrical shock hazards that could be encountered aboard ship, plugs and convenience outlets for use with portable equipment and power tools normally are standard three-prong type. Both plugs and outlets are keyed so that the plug must be in the correct position before it can be inserted into the receptacle. To ensure that the safety factors incorporated in these devices are in serviceable condition and are safe for use, you must perform the following precautions and inspections:

• Inspect the pins of the plug to see that they are firmly in place and are not bent or damaged. • Check the wiring terminals and connections of the plug. Loose connections and frayed wires on the plug surface must be corrected and any foreign matter removed before the plug is inserted into the receptacle. • Use a meter to ensure that the ground pin has a resistance of less than 1 ohm equipment ground. • Do not attempt to insert a grounded-type plug into a grounded receptacle without first aligning the plug properly.

CAUTION

Never use a power tool or a piece of portable test equipment unless you are absolutely sure that it is equipped with a properly grounded conductor.

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1-25 UNCLASSIFIED 1.6 BASIC MEASUREMENTS Electronic measurements involve the fundamental electrical quantities of voltage and current and the inherent characteristics of resistance, capacitance, and inductance. In circuits being tested, voltage and current are dependent upon resistance, capacitance, and inductance for their distribution; therefore, voltage and current measurements are valuable aids in determining circuit component conditions and in the evaluation of symptoms. Practically any reading obtained from the use of test equipment will depend on these basic measured quantities of resistance, capacitance, and inductance.

1.6.1 Voltage and Current Measurements Voltage measurements may be made as part of either preventive or corrective maintenance. These measurements are made using a voltmeter. When compared with voltage charts, these measurements are a valuable aid in locating a trouble quickly and easily. However, if the sensitivity of the test voltmeter differs from that of the voltmeter used in preparing the chart, the voltage measurements must be evaluated before the true circuit conditions can be determined. (Sensitivity in voltmeters was discussed in NEETS, Module 3, Introduction to Circuit Protection, Control, and Measurement.)

Since many of the troubles you find in equipments and systems are the result of abnormal voltages, voltage measurements are a valuable aid in locating trouble. You can measure voltage with a voltmeter without interrupting circuit operation.

Point-to-point voltage measurement charts, usually found in equipment technical manuals, contain the normal operating voltages found in the various stages of the equipment. These voltages are usually measured between indicated points and ground unless otherwise stated. When you begin recording voltage measurements, it is a smart and safe practice to set the voltmeter on the highest range before measuring. This ensures that excessive voltages existing in the circuit will not cause overloading of the meter.

Q-13. On what range should you set the voltmeter prior to taking a voltage measurement? To increase accuracy, you should then set the voltmeter to the appropriate range for the proper comparison with the expected voltage in the voltage charts. When checking voltages, remember that a voltage reading can be obtained across a resistance, even if that resistance is open. The resistance of the meter itself forms a circuit resistance when the meter probes are placed across the open resistance. Therefore, the voltage across the component may appear to be normal or near-normal as you read the meter, but may actually be abnormal when the meter is disconnected from the circuit.

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1-26 UNCLASSIFIED If the internal resistance of the voltmeter is approximately the same value as the resistance being tested, it will indicate a considerably lower voltage than the actual voltage present when the meter is removed from the circuit. The sensitivity (in ohms per volt) of the voltmeter used to prepare the voltage charts is provided on those charts. If a meter of similar sensitivity is available, you should use it to reduce the effects of loading.

The following precautions are general safety measures that apply to the measurement of voltages. Remember that nearly all voltages are dangerous and have often proved fatal to careless technicians. When measuring voltages, be sure to observe the following precautions:

• Set test equipment to the HIGHEST range. • Make sure safety observer knows where to secure power for the equipment under test. • Connect the ground lead of the voltmeter first. • Use only one hand to take measurements (when possible), and put the other hand in your pocket or behind your back. • If the voltage to be measured is less than 300 volts, place the end of the test probe on the point to be tested; use the polarity switch to select positive or negative readings. • If the voltage to be measured is more than 300 volts, proceed as follows: o Shut off circuit power. o Discharge all filter capacitors with a shorting probe. o Temporarily ground the point to be measured. o Connect (clip on) the proper test lead to the high-voltage point. o Move away from the voltmeter. o Turn on circuit power and read the voltmeter. o Turn off circuit power. o Discharge all capacitors before disconnecting the meter.

Q-14. When taking a voltage measurement, which lead of the voltmeter should you connect to the circuit first? Current measurements are not often taken in the course of preventive maintenance or testing. This is because the ammeter (or other current-measuring instrument) must become an actual part of the equipment being tested. The circuit must be opened (desoldered) to connect the ammeter in series with the circuit being tested. Usually, you can take a voltage measurement and use this factor to calculate the circuit current by applying Ohm’s law.

Q-15. Is an ammeter connected in series or in parallel with the circuit under test?

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1-27 UNCLASSIFIED 1.6.2 Resistance Measurements Resistance measurements are a valuable aid to you in locating defective circuits and components during corrective maintenance. Maintenance handbooks for the equipment can often be used to help you take these measurements. These handbooks often contain resistance charts that are referenced to accessible test points within the equipment. Without these charts, taking resistance measurements in a complex circuit is a slow process. The process is slow because one side of the circuit component must often be desoldered to get a true resistance measurement. However, resistance tolerances vary so widely that approximate resistance readings are adequate for most jobs.

Once the most accessible test point is found, an ohmmeter is usually used to take the resistance measurement. Because of the degree of accuracy needed when an ohmmeter is used, proper calibration and understanding of the meter scales is a must. (Topic 2 of this module will discuss these requirements in detail.) When using an ohmmeter, you must observe the following precautions:

• The circuit being tested must be completely de-energized. • Any meters or transistors which can be damaged by the ohmmeter current must be removed before any measurement is made.

Q-16. What must be done to a circuit before you can use an ohmmeter for testing? 1.6.3 Capacitance Measurements Capacitance measurements are usually taken with a capacitance meter. Capacitance tolerances vary even more widely than resistance tolerances. Capacitance tolerances depend on the type of capacitor, the value of capacitance, and the voltage rating. The actual measurement of capacitance is very simple; however, you must make the important decision of whether to reject or to continue to use the capacitor after it has been tested.

The POWER FACTOR of a capacitor is important because it is an indication of the various losses of a capacitor. Power losses can be traced to the dielectric, such as current leakage and dielectric absorption. Current leakage is of considerable importance, especially in electrolytic capacitors.

Q-17. What is the term used to refer to the losses which can be traced to the dielectric of a capacitor?

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1-28 UNCLASSIFIED 1.6.4 Inductance Measurements Inductance measurements are seldom required in the course of troubleshooting. However, inductance measurements are useful in some cases; therefore, bridges (discussed in the next section) are available for making this test. You will find that many capacitance test sets can be used to measure inductance. Most capacitance test sets are furnished with inductance conversion charts if the test equipment scale is not calibrated to read the value of inductance directly.

1.6.5 Capacitance, Inductance, and Resistance Bridges You can measure capacitance, inductance, and resistance for precise accuracy by using ac bridges. These bridges are composed of capacitors, inductors, and resistors in a wide variety of combinations. These bridges are operated on the principle of a dc bridge called a WHEATSTONE BRIDGE.

1.6.5.1 Wheatstone Bridge The Wheatstone bridge is widely used for precision measurements of resistance. The circuit diagram for a Wheatstone bridge is shown in figure 1-5. Resistors R1, R2, and R3 are precision, variable resistors. The value of Rx is an unknown value of resistance that must be determined. After the bridge has been properly balanced (galvanometer G reads zero), the unknown resistance may be determined by means of a simple formula. The galvanometer (an instrument that measures small amounts of current) is inserted across terminals b and d to indicate the condition of balance. When the bridge is properly balanced, no difference in potential exists across terminals b and d; when switch S2 is closed, the galvanometer reading is zero.

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1-29 UNCLASSIFIED

The operation of the bridge is explained in a few logical steps. When the battery switch S1 is closed, electrons flow from the negative terminal of the battery to point a. Here the current divides as it would in any parallel circuit. Part of it passes through R1 and R2; the remainder passes through R3 and Rx. The two currents, I 1 and I2, unite at point c and return to the positive terminal of the battery. The value of I1 depends on the sum of resistance R1 and R2, and the value of I2 depends on the sum of resistances R3 and Rx. In each case, according to Ohm’s law, the current is inversely proportional to the resistance.

Figure 1-5 Wheatstone bridge

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1-30 UNCLASSIFIED R1, R2, and R3 are adjusted so that when S1 is closed, no current flows through G. When the galvanometer shows no deflection, there is no difference of potential between points b and d. All of I1 follows the a b c path and all I2 follows the a b c path. This means that a voltage drop E1 (across R1 between points a and b) is the same as voltage drop E3 (across R3 between points a and d). Similarly, the voltage drops across R2 and Rx (E2 and Ex) are also equal. Expressed algebraically,

E1 = E3

I1R1 = I2R3

and

E2 = Ex

I1R2 = I2Rx

With this information, we can figure the value of the unknown resistor R x. Divide the voltage drops across R1 and R3 by their respective voltage drops across R2 and Rx as follows:

I1R1 I1R2 = I2R3 I2Rx

We can simplify this equation:

R1 R2 = R3 Rx

then we multiply both sides of the expression by Rx to separate it:

Rx = R2R3 Rx

For example, in figure 1-5, we know that R1 is 60 ohms, R2 is 100 ohms, and R3 is 200 ohms. To find the value of R x, we can use our formula as follows:

Rx = R2R3 R1

Rx = 100 × 200 60

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1-31 UNCLASSIFIED Rx = 20,000 60

Rx = 333.33 ohms

1.6.5.2 Use of ac Bridges A wide variety of ac bridge circuits (such as the Wheatstone) may be used for the precision measurement of ac resistance, capacitance, and inductance. Let’s look at ac bridges in terms of functions they perform.

RESISTANCE BRIDGE - An ac signal generator, as shown in figure 1-6, is used as the source of voltage. Current from the generator passes through resistors R1 and R2, which are known as the ratio arms, and through Rs and Rx. Again, Rx is known as resistance. Rs has a standard value and replaces R3 in figure 1-6. When the voltage drops across R2 and Rs are equal, the voltage drops across R2 and Rx are also equal; no difference of potential exists across the meter and no current flows through it. As we discovered with the Wheatstone bridge, when no voltage appears across the meter, the following ratio is true:

Figure 1-6 Resistance bridge (ac)

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1-32 UNCLASSIFIED For example, if in figure 1-6 we know that R1 is 20 ohms, R2 is 40 ohms, and Rs is 60 ohms, we can find the value of Rx using our formula as follows:

Rx = R2Rs R1

Rx = 40 × 60 20

Rx = 2,400 20

Rx = 120 ohms

With the ac signal applied to the bridge, R1 and R2 are varied until a zero reading is seen on the meter. Zero deflection indicates that the bridge is balanced. (NOTE: In actual practice, the variables are adjusted for a minimum reading since the phase difference between the two legs will not always allow a zero reading.)

CAPACITANCE BRIDGE - Because current varies inversely with resistance and directly with capacitance, an inverse proportion exists between the four arms of the bridge in figure 1-7; the right side of our expression is inverted from the resistance bridge expression as follows:

R1 R2 = Cx Cs

Cx = R1Cs R2

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1-33 UNCLASSIFIED

Q-18. What effect does an increase in capacitance have on a capacitor’s opposition to current flow? Because R1 and R2 are expressed in the same units, the equation R1/R2 becomes a simple multiplication factor. This equation provides a numerical value for Cx and will be in the same units as Cs (farad, microfarad, and so forth).

Similarly, the following resistance ratio exists between the four arms of the bridge, just as in the resistance bridge expression discussed earlier:

R1 R2 = Rs Rx

or

Rx = R2Rs R1

Figure 1-7 Capacitance bridge

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1-34 UNCLASSIFIED Thus, both the unknown resistance and capacitance, Rx and Cx, can be estimated in terms of known resistance R1, R2, Rs, and known capacitance Cs.

In figure 1-7, for example, we know that R1 is 20 ohms, R2 is 40 ohms, Rs is 60 ohms, and Cs is 10 microfarads. We can find the values of Cx and Rx by using the respective formulas as follows:

Cx = R1Cs R2

Cx = 20 × 10 40

Cx = 200 40

Cx = 5 microfarads

and

Rx = R2Rs R1

Rx = 40 × 60 20

Rx = 2,400 20

Rx = 120 ohms

Q-19. When a bridge is used to measure resistance, what is the value of R x if R1 equals 80 ohms, R2 equals 120 ohms, and R3 equals 280 ohms?

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1-35 UNCLASSIFIED INDUCTANCE BRIDGE - The value of the unknown inductance Lx may be determined by means of the simple bridge circuit shown in figure 1-8. Ratio arms R1 and R2 are accurately calibrated resistors. Ls is a standard inductor with a known inductance; Rs is the known resistance, and Rx represents the resistance of the unknown inductor.

The ac signal is applied to the bridge, and variable resistors R1 and R2 are adjusted for a minimum or zero deflection of the meter, indicating a condition of balance. When the bridge is balanced, the following formulas may be used to find Lx.

(NOTE: The right side of this expression is NOT inverse as it was in the capacitance bridge.)

R1 R2 = Ls Lx

R2Ls R1 = Lx

Figure 1-8 Inductance bridge

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1-36 UNCLASSIFIED and

R1 R2 = Rs Rx

or

Rx = R2Rs R1

In figure 1-8, for example, the values of R1, R2, and Rs are 20, 40, and 60 ohms, respectively. The value of Ls is 10 millihenries. We can find the values of Rx and Lx by using their respective formulas as follows:

Lx = R2Ls R1

Lx = 40 × 10 20

Lx = 400 20

Lx = 20 millihenries

and

Rx = R2Rs R1

Rx = 40 × 60 20

Rx = 2,400 20

Rx = 120 ohms

Thus, both the unknown resistance and inductance can be estimated in terms of the known values for R1, R2, R s, and Ls.

Q-20. When an unknown capacitance is tested with a bridge, what is the value of C x if R1 equals 70 ohms, R2 equals 150 ohms, and Cs equals 550 microfarads?

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1-37 UNCLASSIFIED 1.7 SUMMARY The important points of this chapter are summarized in the following paragraphs:

The JETDS SYSTEM is jointly used by all branches of the military to identify equipments by a system of standardized nomenclatures.

GPETE is test equipment that has the capability, without modifications, to generate, modify, or measure a range of parameters of electronic functions required to test two or more equipments or systems of basically different design. All GPETE are listed in Standard General Purpose Electronic Test Equipment, MIL-STD-1364 (series).

SPETE is test equipment that is specifically designed to generate, modify, or measure a range of parameters of electronic functions of a specific or peculiar nature required to test a single equipment or system.

The SHIP CONFIGURATION AND LOGISTICS INFORMATION SYSTEM (SCLSIS) program is designed to keep track of equipment configuration changes in the fleet.

The SCLSIS program has two basic elements, VALIDATION and INVENTORY UPDATING.

The CALIBRATION STATUS of any items of test equipment can be determined by the information recorded on the calibration label or tag located on the equipment.

The CALIBRATED label, with black lettering on a white background, indicates the instrument to which it is attached is within tolerance on all scales.

The CALIBRATED—REFER TO REPORT label, with red lettering on a white background, is used when actual measurement values must be known to use the instrument.

The SPECIAL CALIBRATION label, with black lettering on a yellow background, is used when some unusual or special condition in the calibration should be drawn to your attention.

The USER CALIBRATION label indicates that you should calibrate the test and measuring instrument instead of sending the instrument to a calibration facility.

The INACTIVE—CALIBRATE BEFORE USE label is used when a piece of test equipment due for recalibration will not be used for some time in the future.

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1-38 UNCLASSIFIED The CALIBRATION NOT REQUIRED label is used on test instruments listed in the Metrology Requirements List (METRL) as not requiring calibration.

The REJECTED label is attached to a test instrument that fails to meet the acceptance criteria during calibration and cannot be repaired.

The CALIBRATION VOID IF SEAL BROKEN label is placed over readily accessible adjustments to prevent tampering by the user when such tampering could affect the calibration.

The MEASURE system is designed to standardize the recall and scheduling of test, measurement, and diagnostic equipment into calibration facilities and for the documentation of actions performed by the calibration facility.

MAINTENANCE is work done to correct, reduce, or counteract wear and damage to equipment.

PREVENTIVE MAINTENANCE consists of checks to determine weather equipment is functioning properly. It also consists of visual inspections of cabling and equipment for damage and to determine if lubrication is needed.

CORRECTIVE MAINTENANCE is used to isolate troubles by means of test techniques and practices that realign or readjust equipment or otherwise bring the equipment back up to proper performance.

SENSITIVITY of the voltmeter is always given on the voltage charts for a particular piece of equipment. You should always use a voltmeter of similar sensitivity to the equipment to diminish the effects of circuit loading.

CURRENT MEASUREMENTS are not often taken in the course of testing because the ammeter (or other current measuring device) must become an actual part of the equipment being tested. The circuit must be opened for necessary connection of the meter. Usually you can use a voltage measurement to calculate the circuit current by applying Ohm’s law.

You should observe the following PRECAUTIONS when using an ohmmeter:

1. The circuit being tested must be completely de-energized. 2. Any circuit components which can be damaged by ohmmeter current must be removed before any measurement is made.

The WHEATSTONE BRIDGE is used for precise measurement of resistance.

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1-39 UNCLASSIFIED The CAPACITANCE BRIDGE is used for measuring an unknown capacitance.

An INDUCTANCE BRIDGE is used to find the value of an unknown inductance

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1-40 UNCLASSIFIED ANSWERS TO QUESTIONS Q1. THROUGH Q20.

A-1. Joint Electronics Type Designation System (JETDS).

A-2. General-purpose electronic test equipment (GPETE) and special-purpose electronic test equipment (SPETE).

A-3. Special-purpose electronic test equipment.

A-4. Validation and updating.

A-5. CALIBRATED— REFER TO REPORT.

A-6. SPECIAL CALIBRATION label.

A-7. Maintenance personnel.

A-8. The Chief of Naval Operations.

A-9. Preventive and corrective maintenance.

A-10. Corrective maintenance.

A-11. Current.

A-12. Shorting probe.

A-13. Highest.

A-14. Ground.

A-15. In series.

A-16. It must be de-energized.

A-17. Power losses.

A-18. Opposition to current flow decreases.

A-19. 420 ohms.

A-20. 256 microfarads.

Chapter 6 The Oscilloscope and Spectrum Analyzer

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6-1 UNCLASSIFIED 6 THE OSCILLOSCOPE AND SPECTRUM ANALYZER LEARNING OBJECTIVES

Upon completing this chapter, you should be able to:

1. Describe the purpose of the CRT used in the oscilloscope. 2. Explain the operation of an oscilloscope. 3. Describe the purpose of the controls and indicators found on an oscilloscope. 4. Describe the proper procedure for using a dual-trace oscilloscope. 5. Describe the accessory probes available for use with a dual-trace oscilloscope. 6. Explain the operation of the spectrum analyzer. 7. Describe the purpose of the controls and indicators found on the spectrum analyzer.

6.1 INTRODUCTION One of the most widely used pieces of electronic test equipment is the OSCILLOSCOPE. An oscilloscope is used to show the shape of a video pulse appearing at a selected equipment test point. Although some oscilloscopes are better than others in accurately showing video pulses, all function in fundamentally the same way. If you learn how one oscilloscope operates, you will be able to learn others.

As you will learn in this chapter, there are many different types of oscilloscopes - varying in complexity from the simple to the complex. Before we get into our discussion of the dual-trace oscilloscope, we will first present a general overview of basic single-trace oscilloscope operation. Shortly, we will see how oscilloscopes use a CATHODE-RAY TUBE (CRT) in which controlled electron beams are used to present a visible pattern of graphical data on a fluorescent screen.

Another piece of test equipment used is the SPECTRUM ANALYZER. This test equipment is used to sweep over a band of frequencies to determine what frequencies are being produced by a specific circuit under test, and then the amplitude of each frequency component. An accurate interpretation of the display will allow you to determine the efficiency of the equipment being tested.

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6-2 UNCLASSIFIED 6.2 CATHODE-RAY TUBES A detailed discussion of CATHODE-RAY TUBES (CRTs) is presented in NEETS, Module 6, Electronic Emission, Tubes, and Power Supplies. Before continuing with your study of CRTs in this section, you may want to review chapter 2 of that module.

Cathode-ray tubes used in oscilloscopes consist of an ELECTRON GUN, a DEFLECTION SYSTEM, and a FLUORESCENT SCREEN. All of these elements are enclosed in the evacuated space inside the glass CRT. The electron gun generates electrons and focuses them into a narrow beam. The deflection system moves the beam horizontally and vertically across the screen. The screen is coated with a phosphorous material that glows when struck by the electrons. Figure 6-1 shows the construction of a CRT.

6.2.1 Electron Gun The ELECTRON GUN consists of a HEATER and a CATHODE to generate electrons, a CONTROL GRID to control brightness by controlling electron flow, and two ANODES (FIRST and SECOND). The main purpose of the first (FOCUSING) anode is to focus the electrons into a narrow beam on the screen. The second (ACCELERATING) anode accelerates the electrons as they pass. The control grid is cylindrical and has a small opening in a baffle at one end. The anodes consist of two cylinders that contain baffles (or plates) with small holes in their centers.

Figure 6-1 Construction of a CRT

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6-3 UNCLASSIFIED Q-1. What element controls the number of electrons striking the screen? Q-2. What element is controlled to focus the beam? 6.2.1.1 Cathode and Control Grid As in most conventional electron tubes, the cathode is indirectly heated and emits a cloud of electrons. The control grid is a hollow metal tube placed over the cathode. A small opening is located in the center of a baffle at the end opposite the cathode. The control grid is maintained at a negative potential with respect to the cathode to keep the electrons bunched together.

A high positive potential on the anodes pulls electrons through the hole in the grid. Because the grid is near the cathode, it can control the number of electrons that are emitted. As in an ordinary electron tube, the negative voltage of the grid can be varied either to control electron flow or stop it completely. The brightness (intensity) of the image on the fluorescent screen is determined by the number of electrons striking the screen. This is controlled by the voltage on the control grid.

6.2.1.2 Electrostatic Lenses and Focusing The electron beam is focused by two ELECTROSTATIC FIELDS that exist between the control grid and first anode and between the first and second anodes.

Figure 6-2 shows you how electrons move through the electron gun. The electrostatic field areas are often referred to as LENSES because the fields bend electron streams in the same manner that optical lenses bend light rays. The first electrostatic lens cause the electrons to cross at the first focal point within the field. The second lens bend the spreading streams and return them to a new, second focal point at the CRT.

Q-3. Why are the electrostatic fields between the electron gun elements called lenses?

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6-4 UNCLASSIFIED

Figure 6-2 also shows the relative voltage relationships on the electron-gun elements. The cathode (K) is at a fixed positive voltage with respect to ground. The grid is at a variable negative voltage with respect to the cathode. A fixed positive voltage of several thousand volts is connected to the second (accelerating) anode. The potential of the first (focusing) anode is less positive than the potential of the second anode. The first anode can be varied to place the focal point of the electron beam on the screen of the tube. Control-grid potential is established at the proper level to allow the correct number of electrons through the gun for the desired image intensity.

Q-4. What is the function of the second anode?

Figure 6-2 Formation of an electron beam

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6-5 UNCLASSIFIED 6.2.2 Electron Beam-Deflection System The electron beam is developed, focused, and accelerated by the electron gun. The beam appears on the screen of the CRT as a small, bright dot. If the beam is left in one position, the electrons will soon burn away the illuminating coating in that one area. To be of any use, the beam must be able to move. As you have studied, an electrostatic field can bend the path of a moving electron.

As you have seen in the previous illustrations, the beam of electrons passes through an electrostatic field between two plates. You should remember that electrons are negatively charged and that they will be deflected in the direction of the electric force (from negative to positive). This deflection causes the electrons to follow a curved path while in the electrostatic field.

When the electrons leave the electrostatic field, they will take a straight path to the screen at the angle at which they left the field. Because they were all deflected equally, the electrons will be traveling toward the same spot. Of course, the proper voltages must exist on the anodes to produce the electrostatic field. Changing these voltages changes the focal point of the beam and causes the electron beam to strike the CRT at a different point.

6.2.2.1 Factors Influencing Deflection The ANGLE OF DEFLECTION (the angle the outgoing electron beam makes with the CRT center line axis between the plates) depends on the following factors:

• Length of the deflection field; • Spacing between the deflection plates; • The difference of potential between the plates; and • The accelerating voltage on the second anode.

LENGTH OF DEFLECTION FIELD - As shown in figure 6-3, a long field (long deflection plates) has more time to exert its deflecting forces on an electron beam than does a shorter field (short deflection plates). Therefore, the longer deflection plates can bend the beam to a greater deflection angle.

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Q-5. What effect do longer deflection plates have on the electron beam? SPACING BETWEEN PLATES - As shown in figure 6-4, the closer together the plates, the more effect the electric force has on the deflection angle of the electron beam.

Figure 6-3 Factors influencing length of field Figure 6-4 Spacing between plates

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6-7 UNCLASSIFIED DIFFERENCE OF POTENTIAL - The potential on the plates (figure 6-5) can be varied to cause a wider or narrower deflection angle. The greater the potential, the wider the deflection angle.

Q-7. Is the deflection angle greater with higher or lower potential on the plates? BEAM ACCELERATION - The faster the electrons are moving, the smaller their deflection angle will be, as shown in figure 6-6.

Q-8. Is the deflection angle greater when the beam is moving faster or slower?

Figure 6-5 Differences of potential Figure 6-6 Beam acceleration

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6-8 UNCLASSIFIED 6.2.2.2 Vertical and Horizontal Plates If two sets of deflection plates are placed at right angles to each other inside a CRT (figure 6-7), the electron beam can be controlled in any direction. By varying the potential of the vertical-deflection plates, you can make the spot (beam) on the face of the tube move vertically. The distance the beam moves will be proportional to the change in potential difference between the plates. Changing the potential difference between the horizontal-deflection plates will cause the beam to move a given distance from one side to the other. Directions other than up-down and left-right are achieved by a combination of horizontal and vertical movement.

As shown in figure 6-8, position X of the beam is in the center. It can be moved to position Y by going up 2 units and then right 2 units. Movement of the beam is the result of the simultaneous action of both sets of deflection plates. The electrostatic field between the vertical plates moves the electrons up an amount proportional to 2 units on the screen. As the beam passes between the horizontal plates, it moves to the right an amount proportional to 2 units on the screen.

Figure 6-7 Deflection plate arrangement

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If the amount of deflection from the left and down occurred so that each set of plates acted at the same time, the picture would be like the one in view A of figure 6-9. For example, if the vertical plates moved the beam downward (starting from point X) at the rate of 3 units per second and the horizontal plates moved it to the left at the rate of 1 unit per second, both movements would have been completed in 1 second at point Y. The result would be a straight line.

Figure 6-8 Beam movement on the CRT Figure 6-9 Deflection of the beam

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6-10 UNCLASSIFIED In view B, the potentials on the vertical and horizontal plates change at the same rate. In the same time period, say 1 second, both plates move the beam 1 unit. The horizontal plates have completed their task at the end of 1 second, but the vertical plates have moved the beam only one-third of the required distance. In this case, the picture in view B would appear on the screen.

6.2.2.3 Beam-deflection Plate Action Recall from your study of chapter 2 of this module that waveforms are described in terms of amplitude versus time. You have just seen how the movement of the CRT beam depends on both potential (amplitude) and time.

Q-9. Waveforms are described in terms of what two functions? VERTICAL-DEFLECTION PLATES - We will use figure 6-10 to explain the action of the vertical-deflection plates in signal amplitude measurements. As this discussion begins, remember that vertical-deflection plates are used to show amplitude of a signal, and horizontal-deflection plates are used to show time and/or frequency relationships.

Figure 6-10 Amplitude versus time

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6-11 UNCLASSIFIED 1. From T0 to T1, the vertical plates maintain their static difference in potential and the beam stays at 0 units; the T0 to T1 change causes an increasing potential difference in the horizontal plates, and the beam moves 1 unit to the right.

2. At T1, a positive potential difference change in the vertical plates occurs, which causes the beam to move up (instantaneously) 2 units. This vertical (amplitude) beam location is maintained from T1 to T4; horizontal beam movement continues moving to the right as 3 units of time pass.

3. At T4, an instantaneous negative change in potential of 4 units in amplitude occurs, and the beam moves from +2 to -2 units.

4. From T4 to T7, the beam remains at -2 units. During this time period, the beam continues moving horizontally to the right, indicating the passage of time.

5. At T7, a positive increase of amplitude occurs, and the beam moves vertically from -2 to 0 units. From T7 to T8, no change occurs in vertical beam movement; however, horizontal movement continues with time.

The vertical-plate potential difference follows the voltage of the waveform. The horizontal-plate potential follows the passage of time. Together, they produce the image (trace) produced on the screen by the moving beam.

Q-10. The vertical-deflection plates are used to reproduce what function? Q-11. The horizontal-deflection plates are used to produce what function? HORIZONTAL-DEFLECTION PLATES - Now let's look at horizontal-deflection action. Assume that the resistance of the potentiometer shown in figure 6-11 is spread evenly along its length. When the arm of the potentiometer is at the middle position, the same potential exists on each plate. Since there is zero potential difference between the plates, an electrostatic field is not moved downward at a uniform rate; the right plate will become more positive than the left (you are looking down through the top of the CRT). The electron beam will move to the right from screen point 0 through points 1, 2, 3, and 4 in equal time intervals.

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If the potentiometer arm is moved at the same rate in the opposite direction, the right plate will decrease in positive potential until the beam returns to the 0 position. At that point, the potential difference between the plates is again zero. Moving the arm toward the other end of the resistance causes the left plate to become more positive than the right, and the beam moves from screen points 0 through 4. If the movement of the potentiometer arm is at a uniform (linear) rate, the beam moves at a uniform rate.

Notice that the ends of the deflection plates are bent outward to permit wide-angle deflection of the beam. The vertical plates are bent up and down in the same manner.

Q-12. Why are the ends of the deflection plates bent outward? For ease of explanation, the manual movement of the potentiometer arm is satisfactory to introduce you to horizontal beam movement. However, in the oscilloscope this is not how horizontal deflection is accomplished. Beam movement voltages are produced much faster by sawtooth circuitry. You may want to review the sawtooth generation section in NEETS, Module 9, Introduction to Wave-Generation and Wave-Shaping Circuitry before continuing. Nearly all oscilloscopes with electrostatic deflection apply a sawtooth voltage to the horizontal plates to produce horizontal deflection of the beam, as shown in figure 6-12.

Figure 6-11 Horizontal plates (top view)

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In the figure, the sawtooth generator replaces the potentiometer and is connected to both horizontal plates of the CRT. At the reference line, the potential on both plates is equal. Below the line, the left plate is more positive and the right plate is less positive. This causes the beam to move left. Above the line, the right plate is made more positive than the left and the beam moves to the right. The waveform amplitude causes a uniform movement of the beam across the screen (called TRACE). RETRACE time, shown at the trailing edge of the waveform, quickly deflects the beam back to the starting point.

6.2.3 CRT Graticule A GRATICULE was used in our previous discussion in figure 6-10. It is simply a calibrated scale (made of clear plastic) of amplitude versus time that is placed on the face of the CRT.

The graticule can be used to determine the voltage of waveforms because the DEFLECTION SENSITIVITY of a CRT is uniform throughout the vertical plane of the screen. Deflection sensitivity states the number of inches, centimeters, or millimeters a beam will be deflected for each volt of potential difference applied to the deflection plates. It is directly proportional to the physical length of the deflection plates and their distance from the screen and inversely proportional to the distance between the plates and to the second-anode voltage. Deflection sensitivity is a constant that is dependent on the construction of the tube.

Deflection sensitivity for a given CRT might typically be 0.2 millimeters per volt. This means the spot on the screen will be deflected 0.2 millimeters (about 0.008 inch) when a difference of 1 volt exists between the plates. Sometimes the reciprocal of deflection sensitivity (called DEFLECTION FACTOR) is given. The deflection factor for the example given would be 125 volts per inch (1/0.008).

Figure 6-12 Sawtooth generator

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6-14 UNCLASSIFIED Q-13. What term is used to describe the reciprocal of deflection sensitivity of a scope? In the above example, 125 volts applied between one set of plates would deflect the beam 1 inch on the screen. This means that the deflection caused by small signals would likely not be observed. For this reason, the deflection plates are connected to amplifiers that magnify the signals applied to the vertical input of the scope.

Assume, for example, that a peak-to-peak value of a known voltage applied to the oscilloscope indicates that each inch marking on the graticule is equal to 60 volts. Each of the 10 subdivisions will, therefore, equal a value of 6 volts. Most oscilloscopes have ATTENUATOR controls to decrease or GAIN controls to increase the strength of a signal before it is placed on the deflection plates. Attenuator and gain settings must not be disturbed after the calibration has been made. For maximum accuracy, you should recalibrate the graticule each time a voltage is to be measured.

6.2.4 CRT Designations Cathode-ray tubes are identified by a tube number, such as 2AP1, 2BP4, or 5AP1A. The first number identifies the diameter of the tube face. Typical diameters are 2 inches, 5 inches, and 7 inches. The first letter designates the order in which a tube of a given diameter was registered. The letter-digit combination indicates the type of phosphor (glowing material) used on the inside of the screen. Phosphor P1, which is used in most oscilloscopes, produces a green light at medium PERSISTENCE. Persistence refers to the length of time the phosphor glows after the electron beam is removed. P4 provides a white light and has a short persistence. If a letter appears at the end, it signifies the number of the modification after the original design.

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6-15 UNCLASSIFIED 6.3 OSCILLOSCOPE CONTROL COMPONENTS Although the CRT is a highly versatile device, it cannot operate without control circuits. The type of control circuits required depends on the purpose of the equipment in which the CRT is used.

There are many different types of oscilloscopes. They vary from relatively simple test instruments to highly accurate laboratory models. Although oscilloscopes have different types of circuits, most can be divided into the basic sections shown in figure 6-13: (1) a CRT, (2) a group of control circuits that control the waveform fed to the CRT, (3) a power supply, (4) sweep circuitry, and (5) deflection circuitry.

Q-14. List the circuits that all oscilloscopes have in common.

Figure 6-13 Block diagram of an oscilloscope

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6-16 UNCLASSIFIED Figure 6-14 is a drawing of the front panel of a dual-trace, general-purpose oscilloscope. Oscilloscopes vary greatly in the number of controls and connectors. Usually, the more controls and connectors, the more versatile the instrument. Regardless of the number, all oscilloscopes have similar controls and connectors. Once you learn the fundamental operation of these common controls, you can move with relative ease from one model of oscilloscope to another. Occasionally, controls that serve similar functions will be labeled differently from one model to another. However, you will find that most controls are logically grouped and that their names usually indicate their function.

The oscilloscope in figure 6-14 is called DUAL-TRACE because it can accept and display two vertical signal inputs at the same time - usually for comparison of the two signals or one signal and a reference signal. This scope can also accept just one input. In this case, it is used as a SINGLE-TRACE OSCILLOSCOPE. For the following discussion, we will consider this to be a single-trace oscilloscope. The oscilloscope in the figure is commonly used in the fleet. You are likely to use this one (model AN/USM- 425) or one very similar to it. Let's now look at the front panel controls.

Figure 6-14 Dual-trace oscilloscope

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6-17 UNCLASSIFIED 6.3.1 Components Used to Display the Waveform The CRT DISPLAY SCREEN is used to display the signal (figure 6-15). It allows you to make accurate measurements using the vertical and horizontal graticules, as discussed earlier.

Figure 6-15 CRT display and graticule

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6-18 UNCLASSIFIED 6.3.2 Components Used to Adjust CRT Display Quality The controls in figure 6-16 allow you to adjust for a clear signal display. They also allow you to adjust the display position and magnify the horizontal trace by a factor of 10 (X10). Keep in mind that the controls may be labeled differently from one model to another, depending on the manufacturer. Refer to figure 6-16 as you study the control descriptions in the next paragraphs.

6.3.2.1 INTEN (Intensity) Control The INTEN (intensity) control (sometimes called BRIGHTNESS) adjusts the brightness of the beam on the CRT. The control is rotated in a clockwise direction to increase the intensity of the beam and should be adjusted to a minimum brightness level that is comfortable for viewing.

Figure 6-16 Quality adjustment for CRT display

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6-19 UNCLASSIFIED 6.3.2.2 FOCUS and ASTIG (Astigmatism) Controls The FOCUS control adjusts the beam size. The ASTIG (astigmatism) control adjusts the beam shape. The FOCUS and ASTIG controls are adjusted together to produce a small, clearly defined circular dot. When displaying a line trace, you will use these same controls to produce a well-defined line. Figure 6-17, view A, shows an out-of-focus beam dot. View B shows the beam in focus. Views C and D show out-of-focus and in-focus traces, respectively.

6.3.2.3 TRACE ROTATION Control The TRACE ROTATION control (figure 6-16) allows for minor adjustments of the horizontal portion of the trace so that you can align it with the horizontal lines on the graticule.

Figure 6-17 Effects of FOCUS and ASTIG (astigmatism) controls

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6-20 UNCLASSIFIED 6.3.2.4 BEAM FINDER Control Occasionally, the trace will actually be located off the CRT (up or down or to the left or right) because of the orientation of the deflection plates. When pushed, the BEAM FINDER (figure 6-16) pulls the beam onto the screen so that you can use the horizontal and vertical POSITION controls to center the spot.

6.3.2.5 Horizontal and Vertical POSITION Controls The horizontal and vertical POSITION controls (figure 6-16) are used to position the trace. Because the graticule is often drawn to represent a graph, some oscilloscopes have the positioning controls labeled to correspond to the X and Y axes of the graph. The X axis represents horizontal movement; the Y axis represents the vertical movement. Figure 6-18 shows the effects of positioning controls on the trace.

In view A, the horizontal control has been adjusted to move the trace too far to the right; in view B, the trace has been moved too far to the left. In view C, the vertical POSITION control (discussed later) has been adjusted to move the trace too close to the top; in view D, the trace has been moved too close to the bottom. View E (figure 6-18) shows the trace properly positioned.

Figure 6-18 Effects of horizontal and vertical controls

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6-21 UNCLASSIFIED 6.3.2.6 10X MAG (Magnifier) Switch The 10X MAG (magnifier) switch (figure 6-16) allows you to magnify the displayed signal by a factor of 10 in the horizontal direction. This ability is important when you need to expand the signal to evaluate it carefully.

6.3.3 Components Used to Determine the Amplitude of a Signal We will now discuss the dual-trace components of the scope. You will use these components to determine the amplitude of a signal. Notice in figure 6-19 that the highlighted section at the upper left of the scope looks just the same as the section at the lower left of the scope. This reveals the dual-trace capability section of the scope. The upper left section is the CH (channel) 1 input and is the same as the CH 2 input at the lower left. An input to both inputs at the same time will produce two independent traces on the CRT and use the dual-trace capability of the scope.

Figure 6-19 Components that determine amplitude

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6-22 UNCLASSIFIED For purposes of this introductory discussion, we will present only CH (channel) 1. You should realize that the information presented also applies to CH 2.

6.3.3.1 Vertical POSITION Control The vertical POSITION control allows you to move the beam position up or down, as discussed earlier.

6.3.3.2 Input Connector The vertical input (or signal input) jack connects the signal to be examined to the vertical-deflection amplifier. Some oscilloscopes may have two input jacks, one labeled AC and the other labeled DC. Other models may have a single input jack with an associated switch, such as the AC GRD DC switch in figure 6-19. This switch is used to select the ac or dc connection. In the DC position, the signal is connected directly to the vertical-deflection amplifier; in the AC position, the signal is first fed through a capacitor. Figure 6-20 shows the schematic of one arrangement.

Figure 6-20 Vertical input arrangement

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6-23 UNCLASSIFIED The VERTICAL-DEFLECTION AMPLIFIER increases the amplitude of the input signal level required for the deflection of the CRT beam. The deflection amplifier must not have any other effect on the signal, such as changing the shape (called DISTORTION). Figure 6-21 shows the results of distortion occurring in a deflection amplifier.

6.3.3.3 Attenuator Control An amplifier can handle only a limited range of input amplitudes before it begins to distort the signal. Signal distortion is prevented in oscilloscopes by the incorporation of circuitry that permits adjustment of the input signal amplitude to a level that prevents distortion from occurring. This adjustment is called the ATTENUATOR control in some scopes (VOLTS/DIV and VAR in figure 6-19). This control extends the usefulness of the oscilloscope by enabling it to handle a wide range of signal amplitudes.

The attenuator usually consists of two controls. One is a multi-position (VOLTS/DIV) control, and the other is a variable (VAR) potentiometer. Each position of the control may be marked either as to the amount of voltage required to deflect the beam a unit distance, such as VOLTS/DIV, or as to the amount of attenuation (called the DEFLECTION FACTOR) given to the signal, such as 100, 10, or 1.

Figure 6-21 Deflection amplifier distortion

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6-24 UNCLASSIFIED Suppose the .5 VOLTS/DIV position were selected. In this position, the beam would deflect vertically 1 division for every 0.5 volts of applied signal. If a sine wave occupied 4 divisions peak-to-peak, its amplitude would be 2 volts peak-to-peak (4 × 0.5), as shown in figure 6-22.

The vertical attenuator control (VOLTS/DIV in figure 6-19) provides a means of adjusting the input signal level to the amplifiers by steps. These steps are sequenced from low to high deflection factors. The potentiometer control (VAR in figure 6-19) provides a means of fine, or variable, control between steps. This control may be mounted separately, or it may be mounted on the attenuator control. When the control is mounted separately, it is often marked as FINE GAIN or simply GAIN. When mounted on the attenuator control, it is usually marked VARIABLE or VAR.

The variable control adds attenuation to the step that is selected. Since accurately calibrating a potentiometer is difficult, the variable control is either left unmarked or the front panel is marked off in some convenient units, such as 1-10 and 1-100. The attenuator control, however, can be accurately calibrated. To do this, you turn off the variable control to remove it from the attenuator circuit. This position is usually marked CAL (calibrate) on the panel, or an associated light indicates if the VAR control is on or off. In figure 6-19, the light called UNCAL indicates the VAR control is in the uncalibrated position.

Figure 6-22 Sine wave attenuation

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6-25 UNCLASSIFIED 6.3.4 Components Used to Select the Vertical Operating Mode As we discussed earlier, channel 1 is being used to discuss basic operating procedures for the oscilloscope. Figure 6-23 shows how the vertical mode of operation is selected. The VERT MODE section contains push-button switches that enable you to select channel 1, channel 2, and several other vertical modes of operation. For the present discussion, note only that CH 1 is selected by these switches.

Figure 6-23 Vertical-deflection controls

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6-26 UNCLASSIFIED 6.3.5 Components Used to Determine Period Time of the Display The TIME/DIV (figure 6-24) controls on the scope determine the period time of the displayed waveform. As we discussed earlier, the sweep generator develops the sawtooth waveform that is applied to the horizontal-deflection plates of the CRT. This sawtooth voltage causes the beam to move across the screen. This trace (sometimes called SWEEP) sets the frequency of the TIME BASE of the oscilloscope. The frequency of the time base is variable, which enables the oscilloscope to accept a wide range of input frequencies. Again, two controls are used (figure 6-24). One is a multi-position switch (TIME/DIV) that changes the frequency of the sweep generator in steps. The second control is a potentiometer (VAR) that varies the frequency between steps. Each step on the TIME/DIV control is calibrated. The front panel has markings that group the numbers into microseconds and milliseconds.

Figure 6-24 Period time of the waveform (TIME/DIV)

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6-27 UNCLASSIFIED The potentiometer is labeled VAR, and the panel has an UNCAL indicator that lights when the VAR control is in the variable position. When you desire to accurately measure the time of one cycle of an input signal, turn the VAR control to the CAL position and turn the TIME/DIV switch to select an appropriate time base. Suppose you choose the 10-microsecond position to display two cycles of an input signal, as shown in figure 6-25. One cycle occupies 3 centimeters (small divisions) along the horizontal axis. Each cm has a value of 10 microseconds. Therefore, the time for one cycle equals 30 microseconds (3 × 10). Recall that the frequency for a signal may be found by using the following procedure:

f = 1 time (t)

= 1 30 X 10−6

= 33.33 kHz

In selecting a time base, you should select one that is lower in frequency than the input signal. If the input signal requires 5 milliseconds to complete one cycle and the sawtooth is set for 0.5 milliseconds per centimeter with a 10-centimeter-wide graticule, then approximately one cycle will be displayed. If the time base is set for 1 millisecond per centimeter, approximately two cycles will be displayed. If the time base is set at a frequency higher than the input frequency, only a portion of the input signal will be displayed.

Figure 6-25 Time measurement of a waveform (TIME/DIV)

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6-28 UNCLASSIFIED In the basic oscilloscope, the sweep generator runs continuously (FREE-RUNNING); in more elaborate oscilloscopes, it is normally turned off. In the oscilloscope we’re using as an example, the sweep generator can be triggered by the input signal or by a signal from some other source. (Triggering will be discussed later in this chapter.) This type of oscilloscope is called a triggered oscilloscope. The triggered oscilloscope permits more accurate time measurements to be made and provides a more stable presentation than the non-triggered-type oscilloscope.

On some oscilloscopes, you will find a 10 times (10X) magnification control. As previously mentioned, this allows the displayed sweep to be magnified by a factor of 10.

Q-15. When you select the time base to display a signal, should the time base be the same, higher, or lower than the input signal? 6.3.6 Components Used to Provide a Stable Display The triggering and level controls are used to synchronize the sweep generator with the input signal. This provides a stationary waveform display. If the input signal and horizontal sweep generator are unsynchronized, the pattern tends to jitter, making observations difficult.

The A TRIGGER controls at the lower right of the scope (figure 6-26) are used to control the stability of the oscilloscope CRT display. They are provided to permit you to select the source, polarity, and amplitude of the trigger signal. These controls, labeled A TRIGGER, LEVEL, SOURCE, and SLOPE, are described in the following paragraphs.

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6.3.6.1 SOURCE Control The SOURCE control allows you to select the appropriate source of triggering. You can select input signals from channel 1 or 2, the line (60 hertz), or an external input.

Figure 6-26 Components that control stability

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6-30 UNCLASSIFIED 6.3.6.2 TRIGGER LEVEL/SLOPE Controls The LEVEL control allows you to select the amplitude point of the trigger signal at which the sweep is triggered. The SLOPE lets you select the negative or positive slope of the trigger signal at which the sweep is triggered. The TRIGGER LEVEL (mounted with the TRIGGER SLOPE on some scopes) determines the voltage level required to trigger the sweep. For example, in the TRIGGER modes, the trigger is obtained from the signal to be displayed. The setting of the LEVEL control determines the amplitude point of the input waveform that will be displayed at the start of the sweep.

Figure 6-27 shows some of the displays for a channel that can be obtained for different TRIGGER LEVEL and TRIGGER SLOPE settings. The level is zero and the slope is positive in view A; view B also shows a zero level but a negative slope selection. View C shows the effects of a positive trigger level setting and positive trigger slope setting; view D displays a negative trigger level setting with a positive trigger slope setting. Views E and F have negative slope settings. The difference is that view E has a positive trigger level setting, whereas F has a negative trigger level setting.

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In most scopes, an automatic function of the trigger circuitry allows a free-running trace without a trigger signal. However, when a trigger signal is applied, the circuit reverts to the triggered mode of operation and the sweep is no longer free running. This action provides a trace when no signal is applied.

Synchronization is also used to cause a free-running condition without a trigger signal. Synchronization is not the same as triggering. TRIGGERING refers to a specific action or event that initiates an operation. Without this event, the operation would not occur. In the case of the triggered sweep, the sweep will not be started until a trigger is applied. Each succeeding sweep must have a trigger before a sweep commences. SYNCHRONIZATION, however, means that an operation or event is brought into step with a second operation. Figure 6-27 Effects of SLOPE and TRIGGER LEVEL controls

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6-32 UNCLASSIFIED A sweep circuit that uses synchronization instead of triggering will cause a previously free-running sweep to be locked in step with the synchronizing signal. The TRIGGER LEVEL control setting can be increased until synchronization occurs; but, until that time, an unstable pattern will appear on the CRT face.

6.3.6.3 COUPLING Section The COUPLING section allows you to select from four positions: AC, LF REJ, HF REJ, and DC. The AC position incorporates a coupling capacitor to block any dc component. The LF and HF REJ positions reject low- and high-frequency components, respectively. The DC position provides direct coupling to the trigger circuits. This is useful when you wish to view only the LF or HF component of a signal.

6.3.7 Components Used to Select Scope Triggering The TRIG MODE section in figure 6-28 allows for automatic triggering or normal triggering. In AUTO (automatic), the triggering will be free-running in the absence of a proper trigger input or will trigger on the input signal at frequencies above 20 hertz. In NORM (normal), the vertical channel input will trigger the sweep.

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Figure 6-28 Components to select triggering

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6-34 UNCLASSIFIED 6.3.8 Components Used to Select Horizontal-Deflection Mode For the present, notice only that the HORIZ DISPLAY (horizontal display) in figure 6-29 can be controlled by the TIME/DIV switch. Other switches in this section will be explained later in this chapter.

Figure 6-29 Components to select mode of horizontal deflection

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6-35 UNCLASSIFIED 6.3.9 Components Used to Calibrate the Probe of the Scope In figure 6-30, you can see the components used to calibrate the test probe on the scope. A 1-volt, 2-kilohertz square wave signal is provided for you to adjust the probe for an accurate square wave and to check the vertical gain of the scope. You adjust the probe with a screwdriver, as shown in the figure.

6.3.10 Similarities Among Oscilloscopes The oscilloscope you use may differ in some respects from the one just covered. Controls and circuits may be identified by different names. Many of the circuits will be designed differently. However, all the functions will be fundamentally the same. Before using an oscilloscope, you should carefully study the operator’s manual that comes with it.

Figure 6-30 Components to calibrate probe

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6-36 UNCLASSIFIED 6.4 USING THE OSCILLOSCOPE An oscilloscope can be used for several different types of measurements, such as time, phase, frequency, and amplitude of observed waveforms. Earlier in this chapter, you learned that the oscilloscope is most often used to study the shapes of waveforms when the performance of equipment is being checked. The patterns on the scope are compared with the signals that should appear at test points (according to the technical manual for the equipment under test). You can then determine if the equipment is operating according to peak performance standards.

Q-16. Oscilloscopes are used to measure what quantities? 6.4.1 Turning on the Scope Before turning on the scope, make sure it is plugged into the proper power source. This may seem obvious, but many technicians have turned all knobs on the front panel out of adjustment before they noticed that the power cord was not plugged in. On some scopes, the POWER switch is part of the INTEN (intensity) control. Turn or pull the knob until you hear a click or a panel light comes on (figure 6-31). Let the scope warm up for a few minutes so that voltages in all of the circuits become stabilized.

Figure 6-31 Components to energize scope

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6-37 UNCLASSIFIED 6.4.2 Obtaining a Pattern on the Screen When adjusting a pattern onto the screen, adjust the INTEN (intensity) and FOCUS controls for a bright, sharp line. If other control settings are such that a dot instead of a line appears, turn down the intensity to prevent burning a hole in the screen coating. Because of the different speeds at which the beam travels across the screen, brightness and sharpness will vary at various frequency settings. For this reason, you may have to adjust the INTEN and FOCUS controls occasionally while taking readings.

6.4.3 Number of Cycles on the Screen Because distortion may exist at the beginning and end of a sweep, it is better to place two or three cycles of the waveform on the screen instead of just one, as shown in figure 6-32.

Figure 6-32 Proper signal presentation

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6-38 UNCLASSIFIED The center cycle of three cycles provides you with an undistorted waveform in its correct phase. The center of a two-cycle presentation will appear inverted, but will be undistorted. To place waveforms on the CRT in this manner, you must understand the relationship between horizontal and vertical frequencies. The relationship between the frequencies of the waveform on the vertical plates and the sawtooth on the horizontal plates determines the number of cycles on the screen, as shown in figure 6-33.

The horizontal sweep frequency of the scope should always be kept lower than, or equal to, the waveform frequency; it should never be higher. If the sweep frequency were higher, only a portion of the waveform would be presented on the screen.

If, for example, three cycles of the waveform were to be displayed on the screen, the sweep frequency would be set to one-third the frequency of the input signal. If the input frequency were 12,000 hertz, the sweep frequency would be set at 4,000 hertz for a three- cycle scope presentation. For two cycles, the sweep frequency would be set at 6,000 hertz. If a single cycle were desired, the setting would be the same as the input frequency, 12,000 hertz.

Figure 6-33 Vertical versus horizontal relationship

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6-39 UNCLASSIFIED 6.4.4 Dual-Trace Operation The information presented in the previous sections served as a general overview of basic single-trace oscilloscope operation using one channel and operating controls. Now, you will be introduced to DUALTRACE operation.

Dual-trace operation allows you to view two independent signal sources as a dual display on a single CRT. This operation allows an accurate means of making amplitude, phase, time displacement, or frequency comparisons and measurements between two signals.

A dual-trace oscilloscope should not be confused with a dual-beam oscilloscope. Dual- beam oscilloscopes produce two separate electron beams on a single scope, which can be individually or jointly controlled. Dual-trace refers to a single beam in a CRT that is shared by two channels.

Q-17. Scopes that produce two channels on a single CRT with a single beam are referred to as what types of scopes?

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6-40 UNCLASSIFIED 6.4.4.1 Components Used to Select Vertical-Deflection Operating Mode The VERT MODE controls (figure 6-34) allow you to select the operating mode of the scope for vertical deflection.

CH 1 AND CH 2 - These controls allow you to display signals applied to either channel 1 or channel 2, as discussed earlier.

TRIGGER VIEW - The TRIG VIEW allows you to display the signal that is actually used to trigger the display. (Triggering was discussed earlier.)

Figure 6-34 Components to select vertical operating mode

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6-41 UNCLASSIFIED ALT - The ALT (alternate) mode (figure 6-35) of obtaining a dual trace uses the techniques of GATING between sweeps. This control allows the signal applied to channel 1 to be displayed in its entirety; then, channel 2 is displayed in its entirety. This method of display is continued alternately between the two channels. At slow speeds, one trace begins to fade while the other channel is being gated. Consequently, the ALT mode is not used for slow sweep speeds. The CHOP mode, shown in figure 6-36 (explained next), will not produce a satisfactory dual sweep at high speeds. The ALT mode is deficient at low speeds. Therefore, both are used on dual-trace oscilloscopes to complement each other and give the scope a more dynamic range of operation.

Figure 6-35 ALT (alternate) mode Figure 6-36 CHOP mode

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6-42 UNCLASSIFIED The output dc voltage references on each of the amplifiers are independently adjustable. Therefore, the beam will be deflected by different amounts on each channel if the voltage reference is different at each amplifier output. The output voltage from each amplifier is applied to the deflection plates through the gate. The gate is actually an electronic switch. In this application, it is commonly referred to as a BEAM SWITCH.

Switching is controlled by a high-frequency multivibrator in the CHOP mode. That is, the gate selects the output of one channel and then the other at a high-frequency rate (1200 kilohertz in most oscilloscopes). Because the switching time is very short in a good- quality oscilloscope, the resultant display is two sets of horizontally dashed lines, as shown in figure 6-37, view A.

Figure 6-37 Displaying CHOP mode

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6-43 UNCLASSIFIED Dashed line CH 1 is the output of one channel, while line CH 2 is the output of the other. The trace moves from left to right because of the sawtooth waveform applied to the horizontal plates. A more detailed analysis shows that the beam moves from CH 1 to CH 2 while the gate is connected to the output from one channel. Then, when the gate samples the output of the CH 2 during time 3 to 4, the beam is at a different vertical LOCATION. (This is assuming that CH 2 is at a different voltage reference.) The beam continues in the sequence 5 to 6, 7 to 8, 9 to 10, and 11 to 12 through the rest of one horizontal sweep.

When the chopping frequency is much higher than the horizontal sweep frequency, the number of dashes will be very large. For example, if the chopping occurs at 100 kilohertz and the sweep frequency is 1 kilohertz, each horizontal line would then appear as a series of closely spaced dots, as shown in figure 6-37 view B. As the sweep frequency becomes lower compared to the chopping frequency, the display will show apparently continuous traces; therefore, the CHOP mode is used at low sweep rates.

When signals are applied to the channel amplifiers (view A of figure 6-38), the outputs are changed according to the triggering signal (view B). The resultant pattern (view C) on the screen provides a time-base presentation of the signals of each channel.

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6-44 UNCLASSIFIED

ADD - The ADD switch (shown earlier in figure 6-34) algebraically adds the two signals of channels 1 and 2 together for display.

Figure 6-38 Dual-channel display in CHOP mode

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6-45 UNCLASSIFIED 6.4.4.2 Other Dual-Trace Oscilloscope Controls Most dual-trace oscilloscopes have both an A and B time base for horizontal sweep control. Notice in the upper right corner on our example scope (figure 6-34) the COUPLING, SOURCE LEVEL, and SLOPE controls. These serve the same function as did those same controls in the A time-base section of the scope. The B time base is selected using the same A and B TIME/DIV control (pull out outer knob).

The use of the B time base is controlled by the HORIZ DISPLAY section discussed earlier in the A time-base section. However, inexperienced technicians generally do not use A and B time bases together in the MIXED, A INTEN (intensified), and B D'LYD (delayed) settings. These controls are fully explained in the applicable technical manuals; therefore, we will not discuss the controls in this chapter. Figure 6-39 is a block diagram of a basic dual-trace oscilloscope without the power supplies.

Figure 6-39 Basic dual-trace oscilloscope block diagram

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6-46 UNCLASSIFIED 6.4.5 Accessories The basic dual-trace oscilloscope has one gun assembly and two vertical channels. However, there are many variations. The horizontal sweep channels vary somewhat from equipment to equipment. Some have one time-base circuit and others have two. These two are interdependent in some oscilloscopes and in others they are independently controlled. Also, most modern general-purpose oscilloscopes are constructed of modules. That is, most of the vertical circuitry is contained in a removable plug-in unit, and most of the horizontal circuitry is contained in another plug-in unit.

The main frame of the oscilloscope is often adapted for many other special applications by the design of a variety of plug-in assemblies. This modular feature provides much greater versatility than in a single-trace oscilloscope. For instance, to analyze the characteristics of a transistor, you can replace the dual-trace, plug-in module with a semiconductor curve-tracer plug-in module.

Other plug-in modules available with some oscilloscopes are high-gain, wide-bandwidth amplifiers; differential amplifiers; spectrum analyzers; physiological monitors; and other specialized units. Therefore, the dual-trace capability is a function of the type of plug-in unit that is used with some oscilloscopes.

To get maximum usefulness from an oscilloscope, you must have a means of connecting the desired signal to the oscilloscope input. Aside from cable connections between any equipment output and the oscilloscope input, a variety of probes are available to assist in monitoring signals at almost any point in a circuit. The more common types include 1- TO-1 PROBES, ATTENUATION PROBES, and CURRENT PROBES. Each of these probes may be supplied with several different tips to allow measurement of signals on any type of test point. Figure 6-40 shows some of the more common probe tips.

In choosing the probe to use for a particular measurement, you must consider such factors as circuit loading, signal amplitude, and scope sensitivity.

The 1-to-1 probe offers little or no attenuation of the signal under test and is, therefore, useful for measuring low-level signals. However, circuit loading with the 1-to-1 probe may be a problem. The impedance at the probe tip is the same as the input impedance of the oscilloscope.

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6-47 UNCLASSIFIED

An attenuator probe has an internal high-value resistor in series with the probe tip. This gives the probe a higher input impedance than that of the oscilloscope. Because of the higher input impedance, the probe can measure high-amplitude signals that would overdrive the vertical amplifier if connected directly to the oscilloscope. Figure 6-41 shows a schematic representation of a basic attenuation probe. The 9-megohm resistor in the probe and the 1-megohm input resistor of the oscilloscope form a 10-to-1 voltage divider.

Figure 6-40 Common probe tips Figure 6-41 Basic attenuation probe

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6-48 UNCLASSIFIED Since the probe resistor is in series, the oscilloscope input resistance is 10 megohms when the probe is used. Thus, using the attenuator probe with the oscilloscope causes less circuit loading than using a 1-to-1 probe.

Before using an attenuator probe for measurement of high-frequency signals or for fast- rising waveforms, you must adjust the probe compensating capacitor (C1) according to instructions in the applicable technical manual. Some probes will have an IMPEDANCE EQUALIZER in the end of the cable that attaches to the oscilloscope. The impedance equalizer, when adjusted according to manufacturer’s instructions, assures proper impedance matching between the probe and oscilloscope. An improperly adjusted impedance equalizer will result in erroneous measurements, especially when you are measuring high frequencies or fast-rising signals.

More information on oscilloscope hook-ups can be found in Electronics Information Maintenance Books (EIMB), Test Methods and Practices.

Special current probes have been designed to use the electromagnetic fields produced by a current as it travels through a conductor. This type of probe is clamped around a conductor without disconnecting it from the circuit. The current probe is electrically insulated from the conductor, but the magnetic fields about the conductor induce a potential in the current probe that is proportional to the current through the conductor. Thus, the vertical deflection of the oscilloscope display will be directly proportional to the current through the conductor.

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6-49 UNCLASSIFIED 6.5 SPECTRUM ANALYZER The spectrum analyzer is used to examine the frequency spectrum of radar transmissions, local oscillators, test sets, and any other equipment operating within its testable frequency range. With experience, you will be able to determine definite areas of malfunctioning components within equipment. Successful spectrum analysis depends on the proper operation of a spectrum analyzer and your ability to correctly interpret the displayed frequencies. Although there are many types of spectrum analyzers, we will use the Tektronix, Model 492 for our discussion.

The spectrum analyzer accepts an electrical input signal and displays the frequency and amplitude of the signal on a CRT. On the vertical, or Y, axis, the amplitude is plotted. The frequency would then be found on the horizontal, or X, axis. The overall pattern of this display (figure 6-42) indicates the proportion of power present at the various frequencies within the spectrum (fundamental frequency with sideband frequencies).

Figure 6-42 Spectrum analyzer pattern

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6-50 UNCLASSIFIED 6.5.1 Basic Functional Description The model 492 analyzer can be divided into six basic sections, as follows:

• Converter section; • Intermediate frequency (IF) section; • Display section; • Frequency control section; • Digital control section; and • Power and cooling section.

6.5.1.1 Converter Section The converter section actually consists of three frequency converters, made up of a mixer, local oscillator (LO), and required filters. Only one frequency can be converted at a time and pass through the filters to reach the next converter. The analysis frequency can, however, be changed by altering the frequency of the LO and adjusting the FREQUENCY control knob.

FIRST CONVERTER - The first (front end) converter changes the input signal to a usable IF signal that will either be 829 MHz or 2072 MHz. The IF signal to be produced is dependent on which measurement band selection is currently being used. The 829 MHz IF signal will be selected for bands 2 through 4, while the 2072 MHz IF signal is selected for bands 1 and 5 through 11.

Q-18. The first converter is also known by what other name? SECOND CONVERTER - The second converter actually contains two converters. Only one of these two converters in this section is ever operational, and selected as a result of the measurement band currently being used. The selected converter will convert the frequency received from the first converter to a usable (110 MHz) IF signal, which is then provided to the third converter.

THIRD CONVERTER - This converter takes the 110 MHz IF signal, amplifies it, and then converts it to the final IF of 10 MHz. This signal, in turn, is then passed on to the IF section.

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6-51 UNCLASSIFIED 6.5.1.2 IF Section The IF section receives the final IF signal and uses it to establish the system resolution by using selective filtering. System resolution is selected under microcomputer control among five bandwidths (1 MHz, 100 kHz, 10 kHz, 1 kHz, and 100 Hz). The gain for all bands are then leveled and logarithmically amplified. This is done so that each division of signal change on the CRT display remains equal in change to every other division on the CRT. For example, in the 10-dB-per-division mode, each division of change is equal to a 10 dB difference, regardless of whether the signal appears at the top or bottom of the CRT. The signal needed to produce the video output to the display section is then detected and provided.

6.5.1.3 Display Section The display section provides a representative display of the input signal on the CRT. It accomplishes this by performing the following functions:

• Receives the video signals from the IF section and processes these signals to adjust the vertical drive of the CRT;

• Receives the sweep voltages and processes these signals to produce the horizontal CRT drive plate voltage;

• Receives character data information and generates CRT plate drive signals to display alpha and numeric characters on the CRT;

• Receives control levels from the front panel beam controls and generates unblanking signals to control display presence, brightness, and focus.

The vertical deflection of the beam is increased as the output of the amplitude detector increases. The horizontal position is controlled by the frequency control section and is the frequency analyzed at that instant. The beam sweeps from left to right, low to high frequencies during its analysis. During this analysis, any time a signal is discovered, a vertical deflection will show the strength of the signal at the horizontal position that is the frequency. This results in a display of amplitude as a function of frequency.

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6-52 UNCLASSIFIED 6.5.1.4 Frequency Control Section The frequency control section accomplishes the tuning of the first and second LOs within the converter section. The frequency immediately being analyzed is controlled by the current frequencies of the LOs. To analyze another frequency, you must change an LO frequency to allow the new frequency to be converted to a 10 MHz signal by the converter section. Periodically, the unit sweeps and analyzes a frequency range centered on the frequency set by the FREQUENCY knob. Adjusting the FREQUENCY knob will cause the LOs to be tuned to the new frequency. Only the LOs of the first two converters can be changed to vary the frequency being analyzed.

6.5.1.5 Digital Control Section All the internal functions are controlled from the front panel through the use of a built-in microcomputer. The microcomputer uses an internal bus to receive or produce all communication or control to any section of the analyzer.

6.5.1.6 Power and Cooling Section The main power supply provides almost all the regulated voltages required to operate the unit. The display section provides the high voltage necessary for CRT operation.

The cooling system allows fresh cool air to be routed to all sections of the unit in proportion to the heat that is generated by each section.

6.5.2 Spectrum Analyzer Front Panel Controls, Indicators, and Connectors This section will describe the function of the front panel controls, indicators, and connectors. For a complete description of each function, refer to table 6-1 while reviewing the front panel in figure 6-43. The numbers located in column 1 of table 6-1 equate to the same numbers found on the front panel of figure 6-43. Because most operational functions of this spectrum analyzer are microprocessor-controlled, they are switch-selected rather than adjusted.

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6-53 UNCLASSIFIED

Figure 6-43 Spectrum analyzer front panel controls, indicators, and connectors

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6-54 UNCLASSIFIED Table 6-1 Description of Front Panel Controls, Indicators, and Connectors ITEM FUNCTION DESCRIPTION 1 INTENSITY This knob controls the brightness of the CRT trace and the CRT readout display. The focus is electronically adjusted. 2 READOUT This push button switches the readout display on and off. All spectrum analyzer parameters are displayed except TIME/DIV. The brightness for this display is proportional to the trace brightness and can be readjusted on internal controls only by a qualified technician. 3 GRATILLUM This push button switches the graticule light on and off. 4 BASELINE CLIP This push button, when activated, clips (subdues) the intensity at the baseline. 5 TRIGGERING This area allows one of four triggering modes to be selected by push buttons that illuminate when active. When any of these four are selected, the others are canceled. 5a FREE RUN When activated, the sweep is free-running without regard to trigger signals. 5b INT When activated, the sweep is triggered by any signal at the left edge of the display with an amplitude of 1.0 divisions of the graticule or more. 5c LINE When activated, a sample of the ac power line voltage is used to trigger the sweep. 5d EXT When selected, the sweep is triggered by an external signal (applied through the back panel IN HORZ/TRIG connector) between a minimum and maximum of 0.5 and 50 volt peak. 6 SINGLE SWEEP This push button, plus a ready indicator (No. 7), provides the single sweep operation. When this operation is selected, one sweep is initiated after the sweep circuit has been triggered. Pushing this button does not cancel the other trigger modes. When single sweep is first selected, the present sweep is aborted, but the sweep circuit is not yet armed. An additional push is required to initially arm the sweep. The button must be pushed again to rearm the sweep circuit each time the sweep has run. To cancel single sweep, you must select one of the four trigger mode selections. 7 READY When single sweep is selected, this indicator lights while the sweep circuit is armed and ready for a trigger signal. The indicator stays lit until the sweep is complete. 8 MANUAL SCAN When the TIME/DIV (No. 9c) selector is in the MNL position, this control will manually vary the CRT beam across the full horizontal axis of the display. 9 TIME/DIV Is used to select sweep rates from 5μsec/div to 20μsec/div. This switch also selects AUTP, EXT, and MNL modes. 9a AUTO In this position, the sweep rate is selected by the microcomputer to maintain a calibrated display for any FREQ SPAN/DIV, RESOLUTION, and VIDEO FILTER combination. 9b EXT When selected, this control allows an external input source to be used with the sweep rates. 9c MNL When selected, this control is used in conjunction with No. 8 (see MANUAL SCAN, No. 8). 10 FREQUENCY This control is manually turned to allow you to tune to the center frequency. 11 FREQUENCY RANGE (band) These two push buttons are used to shift the center frequency up or down. Frequency range on the band is displayed on the CRT readout.

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6-55 UNCLASSIFIED ITEM FUNCTION DESCRIPTION 12 F This control is used for measuring the frequency difference between signals. When selected, the frequency readout goes to zero. It will then read out the deviation from this reference to the next frequency desired as the FREQUENCY knob is adjusted. 13 CAL When this is activated, the frequency readout can be calibrated to center the center frequency by adjusting the FREQUENCY control for the correct reading. When accomplished, you should deactivate the CAL mode. 14 DEGAUSS When this button is pressed, current through the local oscillator system is reduced to zero in order to minimize magnetism build-up around the LOs. This is done to enhance the center frequency display and amplitude accuracy. You should do this after every significant frequency change and before calibrating the center frequency. 15 IDENTIFY 500 kHz ONLY The signal identify feature can become functional only when the FREQ SPAN/DIV is set to 500 kHz. When activated (button lit), true signals will change in amplitude on every sweep. Images and spurious response signals will shift horizontally or go completely off the CRT display. To ensure that the signal is changing amplitude every sweep, you should decrease the sweep rate so that each sweep can be analyzed. 16 PHASE LOCK When this control is activated (button lit), it will reduce residual FM when narrow spans are selected. In narrow spans, the phase lock can be turned off or back on by pressing the button. Switching the PHASE LOCK off may cause the signal to shift position. In narrow spans, the signal could shift off the display; however, it will usually return to its phase locked position after a few moments. The microcomputer automatically selects PHASE LOCK for a span/division of 50 kHz or below in bands 1 through 3, 100 kHz or below for band 3, and 200 kHz for bands 5 and above. 17 AUTO RESOLUTION This push button, when activated, will automatically select the bandwidth for FREQ SPAN/DIV, TIME/DIV, and VIDEO FILTER. The internal microcomputer selects the bandwidth to maintain a calibrated display. This can be checked by changing the FREQ SPAN/DIV and observing the bandwidth change on the display. 18 FREQ SPAN/DIV This is a continuous detent control that selects the frequency span/div. The span/div currently selected is displayed on the CRT. The range of the span/div selection is dependent on the frequency band selected:

BAND NARROW SPAN WIDE SPAN 1-3 (0-7.1GHz) 10kHz/Div 200MHz/Div 4-5 (5.4-21GHz) 50 kHz/Div 500 MHz/Div 6 (18-26GHz) 50 kHz/Div 1 GHz/Div 7-8 (26-60GHz) 100 kHz/Div 2 GHz/Div 9 (60-90GHz) 200 kHz/Div 2 GHz/Div 10 (90-140GHz) 500 kHz/Div 5 GHz/Div 11 (140-220GHz) 500 kHz/Div 10 GHz/Div Two additional bands are provided: full band (max span) and 0 Hz span. When max span is selected, the span displayed is the full band. When zero span is selected, time/div is read out instead of span/div.

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6-56 UNCLASSIFIED ITEM FUNCTION DESCRIPTION 19 RESOLUTION BANDWIDTH This is also a continuous detent control that selects the resolution bandwidth. The bandwidth is shown on the CRT display. The range of adjustment is from 1 kHz to 1 MHz in decade steps. When you change the resolution bandwidth with this control, it will deactivate the AUTO RESOLUTION. 20 VERTICAL DISPLAY These four push buttons select the display mode. The scale factor can be seen on the CRT display. 20a 10dB/DIV When this is activated, the dynamic range of the display is calibrated to 80 dB, with each major graticule representing 10 dB. 20b 2dB/DIV When activated, this will increase the resolution so that each major graticule division represents 2 dB. 20c LIN When activated, this selects a linear display between zero volts (bottom graticule line) and the reference level (top graticule line) scaled in volts/division (see REFERENCE LEVEL, No. 23a). 20d PULSE STRETCHER When selected, this increases the fall time of the pulse signals so that very narrow pulses in a line spectrum display can be observed. 21 VIDEO FILTER One of two (NARROW OR WIDE) filters can be activated to reduce video bandwidth and high-frequency components for display noise averaging. The narrow filter is approximately 1/300th of the selected resolution bandwidth with the wide filter being 1/30th the bandwidth. Activating either one will cancel the other. To disable, completely switch filter off. 22 DIGITAL STORAGE Five push buttons and ON control operate the digital storage functions. With none of the push buttons activated, the display will not be stored. 22a VIEW A, VIEW B When either or both of these push buttons are selected, the push button illuminates, and the contents of memory A and/or memory B are displayed. With Save A mode off, data in a memory is interlaced with data from B memory. 22b B-SAVE A When activated, the differential (arithmetic difference) of data in B memory and the saved data in memory A are displayed. SAVE A mode is activated and SAVE A button will be lit. 22c MAX HOLD When activated, the digital storage memory retains the maximum signal amplitude at each memory location. This permits visual monitoring of signal frequency and amplitude at each memory location over an indefinite period of time. This feature is used to measure drift, stability, and record peak amplitude. 22d PEAK/AVERAGE This control selects the amplitude at which the vertical display is either peak detected or averaged. Video signals above the level set by the control (shown by a horizontal line or cursor) are peak detected and stored while video signals below the cursor are digitally averaged and stored. 23 MIN RF ATTEN This control is used to set the minimum amount of RF attenuation. Changing RF LEVEL will not decrease RF attenuation below that set by the MIN RF ATTEN selector. 23a REFERENCE LEVEL This is a continuous control that requests the microcomputer to change the reference level one step for each detent. In the 10 dB/DIV vertical-display mode, the steps are 1 dB or 0.25 dB if the FINE mode (No. 26) is selected.

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6-57 UNCLASSIFIED ITEM FUNCTION DESCRIPTION 23b MIN RF ATTEN DB This selects the lowest value of attenuation allowed: Actual RF attenuation is set by the microcomputer according to the logarithm selected by the MIN NOISE/MIN DISTORTION (No. 27) button. If RF attenuation is increased by changing MIN RF ATTEN, the microcomputer automatically changes IF gain to maintain the current reference level. 24 UNCAL This indicator lights when the display amplitude is no longer calibrated (selecting a sweep rate that is not compatible with the frequency span/div and resolution bandwidth). 25 LOG and AMPL CAL These adjustments calibrate the dynamic range of the display. The LOG calibrates any logarithm gain dB/Div, and the AMPL calibrates the reference level of the top graticule line at the top of the display. 26 FINE When activated, the REFERENCE LEVEL (No. 23a) switches in 1 dB increments for 10 dB/Div display mode, 0.25 dB for 2 dB/Div, and volts 1 dB for LIN display mode. 27 MIN NOISE/MIN DISTORTION This selects one of two logarithms used to control attenuator and IF gain. MIN NOISE (button illuminated) reduces the noise level by reducing attenuation and IF gain 10 dB. MIN DISTORTION (button not illuminated) reduces distortion to its minimum. To observe any changes, the RF attenuation displayed on the CRT readout must be 10 dB higher than that set by the MIN RF ATTEN selector. 28 POWER This is a pull switch that turns power on when extended. 29 RF INPUT This is a 50 ohm coaxial input jack used to input signals of 21GHz or below. The maximum nondestructive input signal level that can be applied to this input is +13 dBm or 30 mW. Signals above 10 dB may cause signal compression. 30 POSITION These controls are used to position the display on the horizontal and vertical axes. 31 CAL OUT This is an output jack that has a calibrated 20 dBm 100 MHz signal, with frequency markers spaced 100 MHz apart. The calibrated 100 MHz marker is used as a reference for calibrating the reference level and log scale. The combination of 100 MHz markers is used to check span and frequency readout accuracy. 32 OUTPUT 1ST AND 2ND LO These jacks provide access to the output of the respective LOs. The jacks must have 50 ohm terminators installed when not connected to an external device. 33 EXTERNAL MIXER When the EXTERNAL MIXER button is activated, bias is provided out the EXTERNAL MIXER port for external waveguide mixers. The IF output from the EXTERNAL MIXER is then applied through the EXTERNAL MIXER port to the second converter for use. 34 PEAKING This control varies the mixer bias for external mixers in the EXTERNAL MIXER mode. This control should be adjusted for maximum signal amplitude.

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6-58 UNCLASSIFIED 6.5.3 Normal Indications Upon Power on With power applied (power knob pulled out), the spectrum analyzer will automatically (upon microcomputer control) go into the following conditions. If you do not find these indications, there is a probably a problem with the unit.

• Vertical display: 10 dB/div;

• Frequency: 0.00 MHz;

• REF level: +30 dB;

• RF attenuation: 60 dB;

• Frequency range: 0.0 to 1.8 GHz;

• Auto resolution: 1 MHz;

• Resolution bandwidth: 1 MHz;

• Freq Span/Div: Max;

• Triggering: Free run;

• Readout: On;

• Digital storage: View A/View B On;

• All other indicators off or inactive.

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6-59 UNCLASSIFIED 6.6 SUMMARY Now that we have completed this chapter, we will briefly review the more important points covered.

A CATHODE-RAY TUBE (CRT) is used in an oscilloscope to display the waveforms.

The CRT used in oscilloscopes consists of an ELECTRON GUN, a DEFLECTION SYSTEM, and a FLUORESCENT SCREEN.

The ELECTRON BEAM in an oscilloscope is allowed to be controlled in any direction by means of HORIZONTAL- and VERTICAL-DEFLECTION PLATES.

VERTICAL-DEFLECTION PLATES are used to show AMPLITUDE of a signal.

HORIZONTAL-DEFLECTION PLATES are used to show TIME and/or FREQUENCY relationship.

A GRATICULE is a calibrated scale of AMPLITUDE VERSUS TIME that is placed on the face of the CRT.

A DUAL-TRACE OSCILLOSCOPE is designed to accept two vertical inputs at the same time. It uses a single beam of electrons shared by two channels.

The SPECTRUM ANALYZER accepts an electrical input signal and displays the signal’s frequency and amplitude on a CRT display.

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6-60 UNCLASSIFIED ANSWERS TO QUESTIONS Q1. THROUGH Q18.

A-1. Control grid.

A-2. The first anode.

A-3. Because they bend electron streams in much the same manner that optical lenses bend light rays.

A-4. It accelerates the electrons emerging from the first anode.

A-5. A greater deflection angle.

A-6. A greater deflection angle.

A-7. Higher potential.

A-8. Slower beam.

A-9. Amplitude and time.

A-10. Amplitude.

A-11. Time and/or frequency relationships.

A-12. To permit wide-angle deflection of the beam.

A-13. Deflection factor.

A-14. A CRT, a group of control circuits, power supply, sweep circuitry, and deflection circuitry.

A-15. Lower.

A-16. Amplitude, phase, time, and frequency.

A-17. Dual-trace oscilloscopes.

A-18. Front end.

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